Field Emission Scanning Electron Microscopy
New Perspectives for Materials Characterization
By: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Paperback | 6 October 2017
At a Glance
Paperback
$109.00
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ISBN: 9789811044328
ISBN-10: 9811044325
Series: Springerbriefs in Applied Sciences and Technology
Published: 6th October 2017
Format: Paperback
Language: English
Number of Pages: 152
Audience: Professional and Scholarly
Publisher: Springer Nature B.V.
Country of Publication: SG
Dimensions (cm): 23.5 x 15.49 x 0.84
Weight (kg): 0.22
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This product is categorised by
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- Non-FictionEngineering & TechnologyTechnology in GeneralNanotechnology
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMaterials ScienceTesting of Materials
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