| Introduction: Overview of Agile Microwave Technologies | p. 1 |
| Introduction | p. 1 |
| Ferroelectrics: The Main Material Properties | p. 2 |
| Ferroelectric Properties | p. 3 |
| Dielectric Properties | p. 4 |
| Acoustic Properties | p. 5 |
| Typical Microwave Paraelectrics | p. 6 |
| Microwave Applications | p. 7 |
| Historical Overview | p. 7 |
| Current Status | p. 8 |
| Potential and Trends | p. 11 |
| Other Agile Microwave Technologies | p. 15 |
| Conclusions | p. 18 |
| References | p. 18 |
| Physics of the Tunable Ferroelectric Devices | p. 21 |
| Introduction | p. 21 |
| Crystal Structure, Non-Polar (Paraelectric) and Polar (Ferroelectric) Phases | p. 22 |
| Dielectric Models of the Ferroelectric and Paraelectric Phases | p. 24 |
| Phenomenological (Thermodynamic) Theory | p. 24 |
| Microscopic Theory | p. 27 |
| Engineering Models of the Dielectric Permittivity | p. 29 |
| Barrett's Formula. Bulk Single Crystals | p. 29 |
| Rupprecht-Bell-Silverman Model. Bulk Single Crystals | p. 30 |
| Vendik's Model. Bulk Single Crystals | p. 31 |
| Granular Ceramics and Composites | p. 32 |
| Columnar Thin Film Ceramics and Composites | p. 34 |
| Models of the Loss Tangent | p. 37 |
| Loss Mechanisms and Early Models of the Loss Tangent | p. 37 |
| Models of the Main Loss Mechanisms | p. 39 |
| Dielectric Nonlinearities | p. 44 |
| Nonlinear Performance of Paraelectrics | p. 44 |
| Nonlinearity and Power Handling Capability | p. 45 |
| Thin Films vs. Bulk | p. 46 |
| Thin Film vs. Bulk Single Crystal | p. 46 |
| Strain | p. 48 |
| The Effects of the Strain on Dielectric Properties of the Thin Films | p. 50 |
| Electro-Acoustic Properties | p. 52 |
| Electrostriction | p. 52 |
| Piezoelectricity and Electrostriction | p. 52 |
| Electric Field Induced Piezoelectricity in Paraelectric Films | p. 54 |
| Bulk Conductivity | p. 56 |
| Conclusions | p. 57 |
| References | p. 57 |
| Fabrication of Ferroelectric Components and Devices | p. 61 |
| Introduction | p. 61 |
| Fabrication of Devices Using Single Crystals | p. 63 |
| Growth Techniques of Single Crystals | p. 63 |
| Structural Characterization | p. 64 |
| Bulk Single Crystal Devices | p. 65 |
| Thin Film Single Crystal Capacitors | p. 66 |
| Fabrication of Devices Using Bulk Ceramics | p. 68 |
| Ceramic Processes | p. 68 |
| Bulk Ceramic Device Fabrication | p. 68 |
| Structure of the Bulk Ferroelectric Ceramics | p. 73 |
| Thick Film, HTCC and LTCC Technologies | p. 74 |
| Fabrication of Devices Using Thick Film Technology | p. 74 |
| Fabrication of HTCC and LTCC Devices | p. 76 |
| Structure of Thick and HTCC/LTCC Films | p. 78 |
| Fabrication of Thin Ferroelectric Films | p. 80 |
| Chemical Deposition Methods | p. 81 |
| Physical Deposition Methods | p. 87 |
| Thin Film Device Processing | p. 98 |
| Coplanar-Plate Configuration | p. 99 |
| Parallel-Plate Configuration | p. 101 |
| Substrate Micromachining and Passivation | p. 106 |
| Substrate Micromachining | p. 106 |
| Substrate Passivation | p. 107 |
| Conclusions | p. 108 |
| References | p. 109 |
| Substrates, Varactors and Passive Components | p. 115 |
| Introduction | p. 115 |
| Substrates | p. 116 |
| Common Substrates | p. 116 |
| Silicon as a Microwave Substrate | p. 118 |
| High Resistivity Silicon | p. 119 |
| Varactors. Basic Designs and Figure of Merit | p. 125 |
| Basic Designs of Ferroelectric Varactors | p. 125 |
| Figure of Merit, Structure and Performance of Ferroelectric Films | p. 128 |
| Correlation of the Design with the Film Structure | p. 129 |
| Varactor Design Issues | p. 134 |
| Equivalent Circuit Model of the Varactors | p. 139 |
| Equivalent Circuit | p. 139 |
| Impedance of Parallel-Plate Varactors | p. 143 |
| Low Frequency and Tuning Performances | p. 144 |
| C-V and P-V Performances | p. 144 |
| I-V Performance | p. 146 |
| Tuneability and Response Time | p. 149 |
| Microwave Performance | p. 151 |
| Parallel-Plate Varactors | p. 151 |
| Coplanar-Plate Varactors | p. 156 |
| Distributed Varactors | p. 161 |
| Power Handling Capability and High Power Varactors | p. 162 |
| Parallel-Plate Varactors | p. 163 |
| Coplanar-Plate Varactors | p. 164 |
| Ferroelectrics in Passive Devices as High Permittivity Dielectric | p. 165 |
| High Density Capacitors | p. 165 |
| MEMs with Ferroelectric Spacers | p. 167 |
| MOS Transistors with Ferroelectrics as Gate Dielectric | p. 168 |
| Conclusions | p. 169 |
| References | p. 170 |
| Ferroelectric Devices | p. 175 |
| Introduction | p. 175 |
| Tunable Delay Lines and Delay Line Type Phase Shifters | p. 176 |
| Figure of Merit | p. 176 |
| Periodically Loaded Lines | p. 177 |
| Uniformly Loaded Delay Lines | p. 182 |
| Other Delay Lines | p. 186 |
| Phase Shifters | p. 187 |
| Figure of Merit of an Analog Phase Shifter | p. 187 |
| Periodically Loaded Line Phase Shifters | p. 188 |
| Reflection Type Phase Shifters | p. 192 |
| Phase Shifters Based on All Pass Filter Topology | p. 192 |
| Other Phase Shifters | p. 194 |
| Tunable Filters | p. 196 |
| Tunable Resonators | p. 196 |
| Bandpass Filters | p. 199 |
| Notch Filters | p. 203 |
| Matching Networks (Impedance Tuners) | p. 204 |
| Power Splitters | p. 206 |
| Antennas | p. 207 |
| Nonlinear Devices | p. 208 |
| Harmonic Generators | p. 208 |
| Frequency Up-Converters | p. 208 |
| Power Limiters | p. 209 |
| Pulse Shapers | p. 210 |
| Parametric Amplifiers | p. 211 |
| TFBARs | p. 212 |
| Basic Designs and Resonant Frequencies | p. 212 |
| Tunable TFBARs | p. 213 |
| Conclusions | p. 217 |
| References | p. 217 |
| Circuit and System Applications of Tunable Ferroelectric Devices | p. 225 |
| Introduction | p. 225 |
| Voltage Controlled Oscillators | p. 226 |
| Amplifiers | p. 229 |
| Steerable Phased Array and Beam Antennas | p. 231 |
| Phased Arrays | p. 231 |
| Steerable Beamformers and Phased Arrays | p. 232 |
| Nontraditional and Lens Type Steerable Beamformers | p. 236 |
| Conclusions | p. 241 |
| References | p. 242 |
| Modeling | p. 245 |
| Introduction | p. 245 |
| Coplanar-Plate Transmission Lines | p. 246 |
| The Equivalent Circuit of the Lines | p. 246 |
| Coplanar-Strip Waveguides | p. 249 |
| Coplanar Waveguides | p. 259 |
| Multilayer Substrate Coplanar-Plate Capacitors | p. 260 |
| Coplanar Plate Capacitors with the Straight Gap (Slot) | p. 260 |
| Interdigital (IDC) Coplanar-Plate Capacitors | p. 265 |
| Parallel-Plate Capacitor | p. 267 |
| Conclusions | p. 271 |
| Appendix A | p. 273 |
| Appendix B | p. 276 |
| Appendix C | p. 280 |
| Appendix D | p. 285 |
| References | p. 285 |
| Measurements of the Dielectric Properties | p. 287 |
| Introduction | p. 287 |
| Resonant Techniques | p. 289 |
| Disk Resonator Technique | p. 289 |
| Courtney Resonator | p. 291 |
| Composite Resonator Method | p. 295 |
| Split-Post Dielectric Resonator Method for Thick and Thin Films | p. 297 |
| Open Resonator Technique | p. 299 |
| Resonant Technique for on Wafer Characterization of the Ferroelectric Varactors and Films | p. 302 |
| Transmission Line Resonator Method | p. 306 |
| Near Field Scanning Microscope | p. 308 |
| Uncertainty of Resonant Measurements | p. 311 |
| Broadband Techniques | p. 317 |
| Transmission/Reflection Method. Bulk Samples in Waveguides | p. 317 |
| Film Measurements Using Coplanar Waveguide (CPW) | p. 321 |
| Film Measurements Using Coupled Microstrip Lines | p. 325 |
| Measurements Using Test Varactors | p. 326 |
| Nonlinear Measurements of Ferroelectrics | p. 330 |
| Switching Time of Ferroelectric Films | p. 332 |
| Conclusions | p. 334 |
| Appendix E | p. 336 |
| Appendix F | p. 343 |
| Appendix G | p. 346 |
| References | p. 347 |
| Potentials and Perspectives | p. 351 |
| Introduction | p. 351 |
| Multiferroics | p. 352 |
| Ferroelectric Nanotubes. Ferromagnetic Nanowires | p. 354 |
| Metamaterials | p. 357 |
| Bridging the "THz Gap" | p. 360 |
| Other Tunable Materials | p. 361 |
| Pyrochlores | p. 362 |
| Resistive Switching in Oxides | p. 364 |
| High Temperature Superconductors (HTS) | p. 367 |
| Liquid Crystals | p. 367 |
| Other/New Effects | p. 370 |
| Resistivity Switching in Doped SrTiO3 | p. 370 |
| Nanoscale Effects | p. 372 |
| Integration with Semiconductors | p. 372 |
| Conclusions | p. 373 |
| References | p. 374 |
| Concluding Remarks | p. 379 |
| Introduction | p. 379 |
| Stabilization of the Temperature Dependences | p. 379 |
| Intrinsic Temperature Dependences of Permittivity and Tuneability | p. 380 |
| Materials and Device Design Based Methods of Stabilization | p. 381 |
| Nonlinearity and Power Handling Capability | p. 384 |
| Hysteresis, Retention, Long Term Stability and Noise | p. 384 |
| Reliability | p. 387 |
| Integration Trends | p. 388 |
| References | p. 389 |
| Index | p. 391 |
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