| List of Authors | p. xix |
| Modelling of the Manufacturing Processes | p. 1 |
| Manufacturing Systems in Electronics Production | p. 1 |
| Abstract Manufacturing Systems | p. 4 |
| Principles and Terms | p. 4 |
| Scheduling | p. 15 |
| Static Process Model | p. 19 |
| Characteristics of Technological Processes | p. 29 |
| The Technological Process Term | p. 29 |
| Characteristics | p. 33 |
| Process Characteristic | p. 47 |
| Explanation of the Process Characteristic Term | p. 47 |
| Operating Point for Technological Processes | p. 50 |
| Adjustment Point and Eccentricity | p. 50 |
| Variation Width of Technological Processes | p. 53 |
| Process Capability | p. 54 |
| Normal-distributed Process Characteristic | p. 54 |
| Measurement Characteristic | p. 55 |
| Measurement Process - Principles and Terms | p. 55 |
| Measurement and Chance | p. 56 |
| Measured Process Characteristic | p. 57 |
| True and Measured Yield | p. 58 |
| References | p. 59 |
| Structures, Graphs and Networks | p. 61 |
| Directed Graphs | p. 61 |
| Network Planning | p. 64 |
| Principles | p. 64 |
| CPM Network and Equivalent Representations | p. 65 |
| Determining Dates in the Network | p. 67 |
| Calculation of Buffer Times in the Network | p. 70 |
| Strategies in Network Planning | p. 70 |
| CPM Cost | p. 72 |
| Product-flow Graphs | p. 74 |
| Weighting Function for Technological Processes | p. 74 |
| Operator Technological Processes | p. 78 |
| Basic Structures of Technological Processes | p. 81 |
| General Structures, Regularities, Relationships | p. 84 |
| Queue Models | p. 89 |
| Demand Flows | p. 90 |
| Classification of Queuing Systems | p. 96 |
| Loss System M/M/1/0 | p. 96 |
| Systems with Queue | p. 102 |
| Petri Nets | p. 105 |
| Definition | p. 105 |
| Example | p. 111 |
| Elementary Links in Petri Nets | p. 114 |
| Extended Petri Nets | p. 116 |
| References | p. 117 |
| Simulation of Manufacturing Processes | p. 119 |
| Principles of the Simulation Methods | p. 119 |
| Definition of Terms | p. 119 |
| Discrete Event Simulation | p. 120 |
| Uses for the Simulation | p. 123 |
| Simulation Project | p. 124 |
| Preparation | p. 124 |
| Performing the Experiment | p. 127 |
| Evaluation | p. 128 |
| Analysis of the Simulation Results | p. 128 |
| Event Trace | p. 128 |
| Online Evaluations | p. 130 |
| Characteristic Variables | p. 131 |
| Representation Forms | p. 135 |
| The simcron MODELLER | p. 142 |
| Overview | p. 142 |
| Model Objects | p. 143 |
| Simulation Run | p. 151 |
| Report | p. 152 |
| Simulation Models | p. 152 |
| Flow Shop and Operating Curve | p. 152 |
| Cluster in Semiconductor Production | p. 155 |
| Quality Processes of Printed-Circuit Board Production | p. 156 |
| Job Shop in Electronics Manufacturing | p. 158 |
| Process-accompanying Simulation | p. 161 |
| Template Model | p. 162 |
| Integration | p. 163 |
| Comparison of Reality and Simulation | p. 167 |
| Model Adaptation | p. 170 |
| References | p. 171 |
| Optimisation of Technological Processes | p. 173 |
| Calculation of Extreme Values | p. 173 |
| Linear Programming | p. 175 |
| Optimisation of Product Volumes - Problem | p. 176 |
| Optimisation of Product Volumes - Solution Method | p. 176 |
| Exchange Method and Simplex Algorithm | p. 180 |
| Dynamic Programming | p. 184 |
| Introduction | p. 184 |
| Example | p. 184 |
| Problem Definition for Dynamic Programming | p. 186 |
| Bellman Recursion Equation | p. 187 |
| Dynamic Programming Strategy | p. 190 |
| Simulation-based Optimisation | p. 191 |
| Principles | p. 191 |
| Optimisation Cycle | p. 195 |
| Search Algorithms | p. 198 |
| Optimisation with Several Goals | p. 201 |
| References | p. 205 |
| Quality Assurance | p. 207 |
| General Goals and Terms | p. 207 |
| Description of Quality Characteristic Variables | p. 209 |
| Quality Characteristic Variables as Random Value | p. 209 |
| Calculation of Probabilities | p. 210 |
| Discrete Quality Characteristics and their Distributions | p. 212 |
| Discrete Quality Characteristic Variables | p. 212 |
| Discrete Probability Distribution | p. 213 |
| Distribution Function | p. 214 |
| Parameters for Discrete Probability Distributions | p. 215 |
| Important Discrete Probability Distributions | p. 217 |
| Uses in Module Production | p. 220 |
| Distribution Functions of Continuous Quality Characteristics | p. 222 |
| Continuous Quality Characteristic Variables | p. 222 |
| Density Function | p. 222 |
| Distribution Function | p. 223 |
| Parameters | p. 224 |
| Important Continuous Distributions | p. 225 |
| Evaluation of Quality Data and Point Estimates | p. 230 |
| Obtaining a Sample | p. 230 |
| Calculation of Statistical Measured Values | p. 233 |
| Random Sample and Sample Functions | p. 235 |
| Distributions and Parameters of Sample Functions | p. 236 |
| Point Estimates for Quality Characteristic Variables | p. 238 |
| Statistic Test and Interval Estimate for Quality Characteristics | p. 241 |
| General Problem Definition | p. 241 |
| Testing the Continuous Quality Characteristic Values | p. 242 |
| Comparing Continuous Quality Characteristic Values | p. 246 |
| Test Procedure for Discrete Quality Characteristic Values | p. 251 |
| Testing of Distributions | p. 252 |
| Confidence Estimates | p. 254 |
| Quality-Control Charts | p. 257 |
| Introduction | p. 257 |
| Process Types | p. 258 |
| Shewhart Quality-Control Charts | p. 260 |
| Control Charts | p. 265 |
| Operations Characteristics of Quality-Control Charts | p. 271 |
| Estimating Process Parameters Using a Preliminary Run | p. 274 |
| Quality Capability of Processes | p. 278 |
| Process Capability | p. 278 |
| Machine Capability | p. 281 |
| Acceptance Sample Test | p. 282 |
| Introduction | p. 282 |
| Single Sampling Plans | p. 284 |
| Determination of Single Sampling Plans | p. 289 |
| Double and Multiple Sampling Plans | p. 290 |
| Sequential Plans | p. 293 |
| Sample Test for the Number of Defects per Unit | p. 295 |
| Variable Sampling Plans | p. 295 |
| Sampling Systems | p. 298 |
| References | p. 301 |
| Process Cost Optimisation | p. 303 |
| Process Chains in Electronics Manufacturing | p. 303 |
| Principal Technologies of Electronics Production | p. 303 |
| Quality Assurance in Modern Electronics Production | p. 307 |
| Quality Cost Optimisation to Reduce Process Costs | p. 310 |
| Goal of Quality Cost Optimisation | p. 310 |
| Yield y and Defect Rate p | p. 311 |
| Basic Quality Cost Model and Quality Distribution | p. 313 |
| Extensions to the Basic Quality Cost Model | p. 321 |
| Features of the Inspection Process | p. 328 |
| Cost Model for the Sampling Test | p. 331 |
| Effects of Process Optimisation | p. 337 |
| Dynamic Programming to Solve Complex Process Chains | p. 340 |
| References | p. 346 |
| Design of Experiments and Regression Analyses | p. 349 |
| General Goals | p. 349 |
| Regression Analysis | p. 350 |
| Problem Specification | p. 350 |
| Simple Linear Regression | p. 352 |
| Dual Linear Regression | p. 358 |
| Restrictions for Performing Regressions | p. 359 |
| Variance Analysis | p. 360 |
| Design of Experiments | p. 363 |
| Complete Factorial Test Designing | p. 363 |
| Reduced Test Designs | p. 367 |
| Test Designs with Repetitions | p. 371 |
| Test Designs for Nonlinear Relationships | p. 371 |
| Special Response Variables | p. 373 |
| Practical Recommendations for Designing Tests | p. 374 |
| Investigation of a Wave Soldering Bath | p. 377 |
| References | p. 387 |
| Reliability of Products and Processes | p. 389 |
| Reliability Characteristics and Models | p. 389 |
| Terms and Reliability Characteristics | p. 389 |
| Lifetime Distributions | p. 393 |
| Exponential Distribution | p. 393 |
| Weibull Distribution | p. 393 |
| Use of Lifetime Distributions | p. 395 |
| Reliability Tests | p. 396 |
| Graphical Evaluations of Reliability Data | p. 396 |
| Computed Evaluations of the Results | p. 398 |
| Markov Chains | p. 402 |
| Technological Process with Two States | p. 402 |
| Two Technological Processes | p. 406 |
| Technological Processes with More than Two States | p. 407 |
| Markov Chains with Infinitely Many States | p. 408 |
| Multidimensional Process and Test Characteristics | p. 409 |
| Two-dimensional Process Characteristic | p. 409 |
| Process Equation | p. 411 |
| Two-dimensional Process Operator | p. 412 |
| Chain Structure of Two Technological Processes | p. 412 |
| Measured Process Characteristic | p. 414 |
| Measured Process Equation | p. 415 |
| Reliability of Technological Processes | p. 416 |
| Process Defect Rate for Several Quality Characteristics | p. 416 |
| Operating Point Drift | p. 418 |
| Momentary Yield | p. 420 |
| Test Blurring | p. 422 |
| References | p. 428 |
| Assembly Accuracy Theory | p. 429 |
| Introduction | p. 429 |
| Positioning Tasks for the Solder Paste Application | p. 430 |
| Machine Accuracy (Positioning Accuracy) | p. 430 |
| Assembly Accuracy | p. 434 |
| Positioning Actions for Component Placing | p. 436 |
| Improvement of the Assembly Accuracy | p. 441 |
| Assembly Accuracy as Quality Characteristic Variables | p. 442 |
| Introduction | p. 442 |
| Placement of Components with Peripheral Leads | p. 444 |
| Placement of Area-array Components | p. 447 |
| Positioning Accuracy as Random Variable | p. 452 |
| Defect Rate for Placement | p. 455 |
| Machine and Process Capability | p. 461 |
| References | p. 463 |
| Appendix - Tables | p. 465 |
| Index | p. 473 |
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