Electronic Properties of Semiconductor Interfaces

By: Winfried MÃ¶nch

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Hardcover | 14 January 2004

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280 Pages

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23.5 x 15.88 x 1.91

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Almost all semiconductor devices contain metal-semiconductor, insulator-semiconductor, insulator-metal and/or semiconductor-semiconductor interfaces; and their electronic properties determine the device characteristics. This is the first monograph that treats the electronic properties of all different types of semiconductor interfaces. Using the continuum of interface-induced gap states (IFIGS) as a unifying theme, M nch explains the band-structure lineup at all types of semiconductor interfaces. These intrinsic IFIGS are the wave-function tails of electron states, which overlap a semiconductor band-gap exactly at the interface, so they originate from the quantum-mechanical tunnel effect. He shows that a more chemical view relates the IFIGS to the partial ionic character of the covalent interface-bonds and that the charge transfer across the interface may be modeled by generalizing Pauling's electronegativity concept. The IFIGS-and-electronegativity theory is used to quantitatively explain the barrier heights and band offsets of well-characterized Schottky contacts and semiconductor heterostructures, respectively.

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"This is the first monograph that treats the electronic properties of all different types of semiconductor interfaces. ... The originality of Moench is more in the fact that he uses the interface-induced gap stats (IFIGS) as the unifying concept of his book. ... Altogether, the present book will be very helpful for theorists in the field of semiconductor interface science." (Michel Wautelet, Physicalia, Vol. 28 (4-6), 2006)

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You Can Find This Book In

Non-Fiction Science Physics Engineering & Technology Mechanical Engineering & Materials Materials Science Other Technologies & Applied Sciences Applied Optics Electronics & Communications Engineering Electronics Engineering Electronic Devices & Materials Semi-Conductors & Super-Conductors

Circuits & Components Energy Technology & Engineering Electrical Engineering Technology in General Engineering in General

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Paperback

Published: 1st December 2010

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Introduction	p. 1
Depletion Layer	p. 21
Determination of Barrier Heights and Offsets	p. 33
Laterally Inhomogeneous Schottky Contacts	p. 83
The IFIGS-and-Electronegativity Theory	p. 107
The MIGS-and-Electronegativity Concept: Experiment and Theory	p. 135
First-Principles Calculations of Barrier Heights and Valence-Band Offsets	p. 181
Temperature and Pressure Effects	p. 189
Barrier Heights and Extrinsic Interface Defects	p. 203
Extrinsic Interface Dipoles	p. 209
Ohmic Contacts	p. 227
Appendix	p. 231
References	p. 235
Subject Index	p. 257
Table of Contents provided by Blackwell. All Rights Reserved.

Electronic Properties of Semiconductor Interfaces

At a Glance

Hardcover

Industry Reviews

Shipping

How to return your order

Defective items

You Can Find This Book In

Other Editions and Formats

Paperback

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