| Foreword | p. V |
| Preface | p. VII |
| Resistively Detected ESR and ENDOR Experiments in Narrow and Wide Quantum Wells: A Comparative Study | p. 1 |
| Introduction | p. 1 |
| Theory | p. 2 |
| Experiment | p. 4 |
| Results | p. 4 |
| Conclusions | p. 11 |
| References | p. 12 |
| Index | p. 13 |
| Electron-Spin Manipulation in Quantum Dot Systems | p. 15 |
| Introduction | p. 15 |
| Single-Spin Manipulation | p. 16 |
| Oscillating Magnetic Field | p. 17 |
| Slanting Zeeman Field | p. 19 |
| Two-Spin Interaction | p. 23 |
| Formulation | p. 23 |
| Hybrid Double Dots | p. 27 |
| Double QD with Slanting Zeeman Field | p. 30 |
| Conclusion | p. 31 |
| References | p. 31 |
| Index | p. 34 |
| Resistively Detected NMR in GaAs/AlGaAs | p. 35 |
| Nuclear Magnetic Resonances with 'Too Few Spins' | p. 36 |
| The 'Too Few Spins' Problem | p. 36 |
| Electrons as an In-Situ Detector of the NMR | p. 37 |
| Recent Advances in GaAs/AlGaAs Semiconductor Quantum Wells | p. 40 |
| Resistively Detected NMR Lineshapes in GaAs/AlGaAs | p. 40 |
| Spin-Lattice Relaxation-Time Measurements | p. 43 |
| Towards a Complete NMR Probe of Quantum Structures | p. 46 |
| NMR in Quantum Electronic Structures of GaAs/AlGaAs | p. 46 |
| NMR on a Chip: Quantum Coherent Control of the Nuclear Spins at the Nanoscale | p. 47 |
| Concluding Remarks | p. 48 |
| References | p. 48 |
| Index | p. 49 |
| Electron-Spin Dynamics in Self-Assembled (In,Ga)As/GaAs Quantum Dots | p. 51 |
| Introduction | p. 51 |
| Experiment | p. 53 |
| Electron g-Factor | p. 54 |
| Creation of Spin Coherence by Spin Initialization | p. 56 |
| Electron-Spin Coherence | p. 65 |
| Summary | p. 77 |
| References | p. 78 |
| Index | p. 80 |
| Single-Electron-Spin Measurements in Si-Based Semiconductor Nanostructures | p. 81 |
| Introduction | p. 81 |
| Measurements of a Single Spin in the SiO2 of a Submicrometer Si Field Effect Transistor | p. 83 |
| Statistical Measurements | p. 84 |
| Detection of Electron-Spin Resonance (ESR) of a Single Spin | p. 88 |
| Single-Shot Measurement | p. 91 |
| Fabrication and Characterization of Electrostatically Confined Quantum-Dot Structures in Si/SiGe Heterostructures | p. 91 |
| Demonstration of a One-Electron Quantum Dot | p. 92 |
| Characterization of the Spin-Transition Sequence | p. 95 |
| Single-Shot Measurement | p. 96 |
| Concluding Remarks | p. 98 |
| References | p. 98 |
| Index | p. 100 |
| Si/SiGe Quantum Devices, Quantum Wells, and Electron-Spin Coherence | p. 101 |
| Introduction | p. 102 |
| Silicon Quantum Devices | p. 103 |
| Spins and Valleys | p. 106 |
| ESR in Silicon Quantum Wells | p. 107 |
| Samples | p. 109 |
| ESR Measurements | p. 11O |
| Decoherence Analysis | p. 111 |
| Results | p. 113 |
| Conclusions | p. 115 |
| References | p. 115 |
| Index | p. 126 |
| Electrical Detection of Electron-Spin Resonance in Two-Dimensional Systems | p. 129 |
| Mechanism of Electrical Detection | p. 129 |
| Determination of Spin-Relaxation Times | p. 133 |
| References | p. 138 |
| Index | p. 140 |
| Quantitative Treatment of Decoherence | p. 141 |
| Introduction | p. 141 |
| Measures of Decoherence | p. 142 |
| Relaxation Timescales | p. 142 |
| Quantum Entropy | p. 143 |
| Fidelity | p. 143 |
| Norm of Deviation | p. 145 |
| Arbitrary Initial States | p. 145 |
| Decoherence of Double Quantum-Dot Charge Qubits | p. 146 |
| Model | p. 147 |
| Piezoelectric Interaction | p. 148 |
| Deformation Interaction | p. 150 |
| Error Estimates During Gate Functions | p. 151 |
| Relaxation During the NOT Gate | p. 151 |
| Dephasing During a Phase Gate | p. 154 |
| Qubit Error Estimates | p. 155 |
| Additivity of Decoherence Measures | p. 157 |
| The Maximal Deviation Norm | p. 158 |
| Upper Bound for Measure of Decoherence | p. 160 |
| References | p. 162 |
| Index | p. 167 |
| Measuring the Charge and Spin States of Electrons on Individual Dopant Atoms in Silicon | p. 169 |
| Quantum Computing with Phosphorus in Silicon | p. 170 |
| Electronic Donor States of Phosphorus in Silicon | p. 171 |
| Coupled Pairs of Phosphorus Donors as Charge Qubits | p. 171 |
| Controlled Single-Ion Implantation | p. 173 |
| Single-Ion Detection with Integrated p-i-n Diodes | p. 173 |
| Charge Sensing with Superconducting RF-SETs | p. 174 |
| Layout and Performance of RF-SET Measurements | p. 175 |
| Initialization and Readout with Schottky Contacts | p. 177 |
| Contacting Atomically Doped Devices | p. 177 |
| Magnetic Resonance in Nanoscale Implanted Devices | p. 178 |
| References | p. 181 |
| Index | p. 182 |
| Electron Spin as a Spectrometer of Nuclear-Spin Noise and Other Fluctuations | p. 183 |
| Introduction | p. 183 |
| Noise, Relaxation, and Decoherence | p. 186 |
| The Bloch-Wangsness-Redfield Master Equation | p. 186 |
| Finite Frequency Phase Fluctuations and Coherence Decay in the Semiclassical-Gaussian Approximation | p. 188 |
| Single-Spin Measurement Versus Ensemble Experiments:Different Coherence Times? | p. 194 |
| Electron-Spin Evolution Due to Nuclear Spins: Isotropic and Anisotropic Hyperfine Interactions, Internuclear Couplings and the Secular Approximation | p. 196 |
| The Electron-Nuclear Spin Hamiltonian | p. 196 |
| Electron-Nuclear-Spin Evolution in the Secular Approximation | p. 198 |
| Beyond the Secular Approximation: Nuclear-Nuclear Interactions Mediated by the Electron Spin Hyperfine Interaction | p. 200 |
| Microscopic Calculation of the Nuclear-Spin Noise Spectrum and Electron-Spin Decoherence | p. 202 |
| Nuclear-Spin Noise | p. 203 |
| Mean Field Theory of Noise Broadening: Quasiparticle Lifetimes | p. 206 |
| Electron Spin-Echo Decay of a Phosphorus Impurity in Silicon: Comparison with Experiment | p. 209 |
| Effective-Mass Model for a Phosphorus Impurity in Silicon | p. 209 |
| Explicit Calculations of the Nuclear-Spin Noise Spectrum and Electron Spin-Echo Decay of a Phosphorus Impurity in Silicon | p. 210 |
| Conclusions and Outlook for the Future | p. 215 |
| References | p. 218 |
| Index | p. 220 |
| A Robust and Fast Method to Compute Shallow States without Adjustable Parameters: Simulations for a Silicon-Based Qubit | p. 221 |
| Shallow Impurities in an External Field | p. 223 |
| Envelope Function Approximation | p. 224 |
| The Central-Cell Correction | p. 225 |
| Numerical Basis Set | p. 226 |
| Phosphorous Impurity in Silicon | p. 226 |
| Bulk Ingredients | p. 227 |
| Theoretical Results: Si:P | p. 227 |
| The Core-Correction Contribution | p. 228 |
| Stark Effect | p. 229 |
| Electric-Field Dependence of Superhyperfine Constants | p. 232 |
| Confinement Effects | p. 234 |
| Conclusions | p. 237 |
| References | p. 238 |
| Index | p. 239 |
| Photon-Assisted Tunneling in Quantum Dots | p. 241 |
| Introduction | p. 241 |
| Theory of Photon-Assisted Tunneling in Quantum Dots | p. 242 |
| Hamiltonian Formalism of Tunneling under Microwave Irradiation | p. 243 |
| Tunneling in Quantum Dots under Microwave Irradiation | p. 244 |
| Typical Regimes of Operation | p. 246 |
| Experimental Results in III-V Heterostructure Quantum Dots | p. 247 |
| Group IV Heterostructure Quantum Dots | p. 250 |
| Si/SiO2 nanoFET Quantum Dots | p. 252 |
| Conclusions | p. 256 |
| References | p. 257 |
| Index | p. 258 |
| Index | p. 259 |
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