DNA Damage Recognition

By: Wolfram Siede (Editor), Paul W. Doetsch (Editor)

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Hardcover | 19 September 2005 | Edition Number 1

At a Glance

Hardcover
894 Pages

Dimensions(cm)
25.4 x 17.78 x 4.78

Hardcover

RRP $599.00

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Stands as the most comprehensive guide to the subject-covering every essential topic related to DNA damage identification and repair.

Covering a wide array of topics from bacteria to human cells, this book summarizes recent developments in DNA damage repair and recognition while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways.

about the editors...

WOLFRAM SIEDE is Associate Professor, Department of Cell Biology and Genetics, University of North Texas Health Science Center, Fort Worth. He received the Ph.D. degree (1986) from Johann Wolfgang Goethe University, Frankfurt Germany.

YOKE WAH KOW is Professor, Department of Radiation Oncology, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1981) from Brandeis University, Waltham, Massachusetts.

PAUL W. DOETSCH is Professor, Departments of Biochemistry, Radiation Oncology, and Hematology and Oncology, and Associate Director for Basic Research, Winship Cancer Institute, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1982) from Temple University School of Medicine, Philadelphia, Pennsylvania.

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