Design and Test Technology for Dependable Systems-on-Chip

By: Raimund Ubar (Editor), Jaan Raik (Editor), Heinrich Theodor Vierhaus (Editor)

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Hardcover | 31 December 2010

At a Glance

Hardcover
580 Pages

Dimensions(cm)
29.85 x 22.86 x 3.81

Hardcover

$302.99

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Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

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