| Introduction | p. 1 |
| Crystal Lattices | p. 3 |
| The Lattice | p. 3 |
| The Unit Cell | p. 4 |
| Atom Parameters | p. 5 |
| The Seven Crystal Systems | p. 6 |
| The Fourteen Bravais Lattices | p. 7 |
| The Hexagonal, Trigonal and Rhombohedral Systems | p. 8 |
| The Reduced Cell | p. 9 |
| The Geometry of X-Ray Diffraction | p. 13 |
| X-Rays | p. 13 |
| Interference by a One-Dimensional Lattice | p. 16 |
| The Laue Equations | p. 18 |
| Lattice Planes and hkl-Indices | p. 20 |
| The Bragg Equation | p. 22 |
| Higher Orders of Diffraction | p. 23 |
| The Quadratic Form of the Bragg Equation | p. 23 |
| The Reciprocal Lattice | p. 27 |
| From the Direct to the Reciprocal Lattice | p. 27 |
| The Ewald Construction | p. 30 |
| Structure Factors | p. 33 |
| Atom Formfactors | p. 33 |
| Atom Displacement Factors | p. 35 |
| Structure Factors | p. 37 |
| Crystal Symmetry | p. 41 |
| Simple Symmetry Elements | p. 41 |
| Coupling of Symmetry Elements | p. 42 |
| Combination of Symmetry Elements | p. 44 |
| Symmetry Directions | p. 44 |
| Symmetry Elements Involving Translation | p. 46 |
| Combination of Translation with Other Symmetry Elements | p. 46 |
| Coupling of Translation with Other Symmetry Elements | p. 46 |
| The 230 Space Groups | p. 52 |
| Space-group Notation in International Tables for Crystallography | p. 52 |
| Centrosymmetric Crystal Structures | p. 55 |
| The Asymmetric Unit | p. 56 |
| Space Group Types | p. 57 |
| Group-Subgroup Relationships | p. 57 |
| Visible Effects of Symmetry | p. 58 |
| Microscopic Structure | p. 58 |
| Macroscopic Properties and Crystal Classes | p. 59 |
| Symmetry of the Lattice | p. 59 |
| Symmetry of the Diffraction Pattern--The Laue Groups | p. 59 |
| Determination of the Space Group | p. 61 |
| Determination of the Laue Group | p. 61 |
| Systematic Absences | p. 62 |
| Transformations | p. 65 |
| Experimental Methods | p. 67 |
| Growth, Choice and Mounting of a Single Crystal | p. 67 |
| Measuring the Diffraction Pattern of Single Crystals | p. 71 |
| Film Methods | p. 71 |
| The Four-circle (serial) Diffractometer | p. 74 |
| Reflection profile and scan type | p. 78 |
| Area Detector Systems | p. 81 |
| Data Reduction | p. 86 |
| Lp correction | p. 86 |
| Standard Uncertainty | p. 87 |
| Absorption Correction | p. 89 |
| Other Diffraction Methods | p. 91 |
| Neutron Scattering | p. 91 |
| Electron Scattering | p. 92 |
| Structure Solution | p. 93 |
| Fourier Transforms | p. 93 |
| Patterson Methods | p. 95 |
| Symmetry in Patterson Space | p. 97 |
| Structure Solution Using Harker Peaks | p. 97 |
| Patterson shift methods | p. 99 |
| Direct Methods | p. 100 |
| Harker-Kasper Inequalities | p. 100 |
| Normalized Structure Factors | p. 101 |
| The Sayre Equation | p. 102 |
| The Triplet Relationship | p. 103 |
| Origin Fixation | p. 105 |
| Strategies of Phase Determination | p. 106 |
| Structure Refinement | p. 111 |
| The Method of Least Squares | p. 111 |
| Refinement Based on F[subscript o] or F[superscript 2 subscript o] Data | p. 115 |
| Weights | p. 116 |
| Crystallographic R-Values | p. 118 |
| Refinement Techniques | p. 119 |
| Location and Treatment of Hydrogen Atoms | p. 120 |
| Restricted Refinement | p. 121 |
| Damping | p. 122 |
| Symmetry Restrictions | p. 122 |
| Residual Electron Density | p. 123 |
| Rietveld Refinement | p. 124 |
| Additional Topics | p. 127 |
| Disorder | p. 127 |
| Site Occupancy Disorder | p. 127 |
| Positional and Orientational Disorder | p. 128 |
| One- and Two-Dimensional Disorder | p. 130 |
| Modulated Structures | p. 131 |
| Quasicrystals | p. 131 |
| Anomalous Dispersion and "Absolute Structure" | p. 132 |
| Chiral and Polar Space Groups | p. 137 |
| Extinction | p. 139 |
| The Renninger Effect | p. 141 |
| The [lambda]/2-Effect | p. 142 |
| Thermal Diffuse Scattering (TDS) | p. 143 |
| Errors and Pitfalls | p. 145 |
| Wrong Atom-Types | p. 145 |
| Twinning | p. 146 |
| Classification by the Twin-Element | p. 147 |
| Classification According to Macroscopic Appearance | p. 147 |
| Classification According to Origin | p. 148 |
| Diffraction Patterns of Twinned Crystals and their Interpretation | p. 149 |
| Twinning or Disorder? | p. 155 |
| False Unit Cells | p. 155 |
| Space Group Errors | p. 156 |
| Misplaced Origins | p. 158 |
| Poor Atom Displacement Parameters | p. 159 |
| Interpretation and Presentation of Results | p. 161 |
| Bond Lengths and Bond Angles | p. 161 |
| Best Planes and Torsion Angles | p. 162 |
| Structural Geometry and Symmetry | p. 163 |
| Structural Diagrams | p. 165 |
| Electron Density | p. 169 |
| Crystallographic Databases | p. 171 |
| The Inorganic Crystal Structure Database (ICSD) | p. 171 |
| The Cambridge Structural Database (CSD) | p. 171 |
| The Metals Crystallographic Data File (CRYST-MET) | p. 175 |
| Other Collections of Crystal Structure Data | p. 175 |
| Deposition of Structural Data in Data Bases | p. 175 |
| Crystallography on the Internet | p. 176 |
| Outline of a Crystal Structure Determination | p. 177 |
| Worked Example of a Structure Determination | p. 181 |
| Bibliography | p. 199 |
| Index | p. 205 |
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