
Atomic and Nuclear Analytical Methods
XRF, M¶ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques
By: Hem Raj Verma
Hardcover | 2 May 2007
At a Glance
Hardcover
$409.00
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ISBN: 9783540302773
ISBN-10: 3540302778
Published: 2nd May 2007
Format: Hardcover
Language: English
Number of Pages: 392
Audience: Professional and Scholarly
Publisher: Springer Nature B.V.
Country of Publication: DE
Dimensions (cm): 22.86 x 15.24 x 2.54
Weight (kg): 0.7
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You Can Find This Book In
This product is categorised by
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMaterials Science
- Non-FictionScienceChemistryAnalytical ChemistrySpectrum Analysis
- Non-FictionEngineering & TechnologyTechnology in GeneralInstruments & Instrumentation EngineeringEngineering Measurement & Calibration
- Non-FictionScienceScience in GeneralScientific StandardsMensuration & Systems of Measurement
- Non-FictionSciencePhysicsNuclear Physics
- Non-FictionSciencePhysicsOptical Physics























