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Advanced Ta-Based Diffusion Barriers for Cu Interconnects - Rene Hubner

Advanced Ta-Based Diffusion Barriers for Cu Interconnects

By: Rene Hubner

Paperback | 1 May 2008

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Preface; Introduction; Experimental Details; Microstructure and Functional Properties of as-Deposited Ta-Based Diffusion Barriers; Thermal Stability of Ta-Based Diffusion Barriers in SiO2; Trace-Analytical Techniques for a Sensitive Proof of Cu Diffusion; Thermal Stability of Ta-Based Diffusion Barriers on Silicon and Barrier Failure Mechanisms; Conclusion; Index.

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