
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
By: Ruijing Shen, Sheldon X. -D. Tan, Hao Yu
eText | 8 July 2014
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ISBN: 9781461407881
ISBN-10: 1461407885
Published: 8th July 2014
Format: ePUB
Language: English
Publisher: Springer Nature
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Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringCircuits & ComponentsTechnology in GeneralNanotechnologyComputing & I.T.Graphical & Digital Media ApplicationsComputer-Aided Design CADIndustrial Chemistry & Manufacturing TechnologiesOther Manufacturing Technologies
This product is categorised by
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringCircuits & Components
- Non-FictionEngineering & TechnologyTechnology in GeneralNanotechnology
- Non-FictionComputing & I.T.Graphical & Digital Media ApplicationsComputer-Aided Design CAD
- Non-FictionEngineering & TechnologyIndustrial Chemistry & Manufacturing TechnologiesOther Manufacturing TechnologiesPrecision Instruments Manufacture
























