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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science : IOP Concise Physics - Sarah Fearn

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

IOP Concise Physics

Paperback

$59.14

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science : IOP Concise Physics - Sarah Fearn

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

IOP Concise Physics

Hardcover

$202.74

Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition) : IOP ebooks - Alexander ) Shard

Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)

IOP ebooks

Alexander ) Shard and Sarah Fearn

Hardcover

$154.00

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