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Results for author 'Philippe Pougnet'

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Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties - Pierre-Richard Dahoo

Applications and Metrology at Nanometer Scale 1

Smart Materials, Electromagnetic Waves and Uncertainties

Pierre-Richard Dahoo, Philippe Pougnet and Abdelkhalak El Hami

Hardcover

RRP $325.55

$324.75

Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method - Pierre-Richard Dahoo

Applications and Metrology at Nanometer-Scale 2

Measurement Systems, Quantum Engineering and RBDO Method

Pierre-Richard Dahoo, Philippe Pougnet and Abdelkhalak El Hami

Hardcover

RRP $325.55

$324.75

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