Scanning Probe Microscopy

Cover -- Contents -- List of Contributors -- About the Editors -- VOLUME II -- Part III. Electrical SPM Characterization of Materials and Devices -- Ch. III. 1. Scanning Voltage Microscopy: Investigating the Inner Workings of Optoelectronic Devices -- Ch. III. 2. Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces -- Ch. III. 3. Electromechanical Behavior in Biological Systems at the Nanoscale -- Ch. III. 4. Scanning Capacitance Microscopy: Applications in Failure Analysis, Active Device Imaging, and Radiation Effects -- Ch. III. 5. Kelvin Probe Force Microscopy of Semiconductors -- Ch. III. 6. Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy -- Ch. III. 7. Electron Flow Through Molecular Structures -- Ch. III. 8. Electrical Characterization of Perovskite Nanostructures by SPM -- Ch. III. 9. SPM Measurements of Electric Properties of Organic Molecules -- Ch. III. 10. High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices -- Part IV. Electrical Nanofabrication -- Ch. IV. 1. Electrical SPM-Based Nanofabrication Techniques -- Ch. IV. 2. Fundamental Science and Lithographic Applications of Scanning Probe Oxidation -- Ch. IV. 3. UHV-STM Nanofabrication on Silicon -- Ch. IV. 4. Ferroelectric Lithography -- Ch. IV. 5. Patterned Self-Assembled Monolayers via Scanning Probe Lithography -- Ch. IV. 6. Resistive Probe Storage: Read/Write Mechanism -- VOLUME I -- Introduction: Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization -- Part I. SPM Techniques for Electrical Characterization -- Ch. I.1. Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport -- Ch. I.2. Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy -- Ch. I.3. Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics -- Ch. I.4. Principles of Kelvin Probe Force Microscopy -- Ch. I.5. Frequency-Dependent Transport Imaging by Scanning Probe Microscopy -- Ch. I.6. Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy -- Ch. I.7. Principles of Near-Field Microwave Microscopy -- Ch. I.8. Electromagnetic Singularities and Resonances in Near-Field Optical Probes -- Ch. I.9. Electrochemical SPM: Fundamentals and Applications -- Ch. I.10. Near-Field High-Frequency Probing -- Part II. Electrical and Electromechanical Imaging at the Limits of Resolution -- Ch. II. 1. Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors -- Ch. II. 2. Spin-Polarized Scanning Tunneling Microscopy -- Ch. II. 3. Scanning Probe Measurements of ElectronTransport in Molecules -- Ch. II. 4. Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices -- Ch. II. 5. Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks -- Ch. II. 6. Theory of Scanning Probe Microscopy -- Ch. II. 7. Multi-Probe Scanning Tunneling Microscopy -- Ch. II. 8. Dynamic Force Microscopy and Spectroscopy in Vacuum -- Ch. II. 9. Scanning Tunneling Microscopy and Spectroscopy of Manganites.