Practical Guide to Materials Characterization

Chapter 1: Basics of Material Characterization Techniques
1.1 Introduction
1.2 Electromagnetic Spectrum and Characteristics
1.3 Production of different Radiations
1.4 Optical Properties
1.4.1 Reflection
1.4.2 Refraction
1.4.3 Absorption
1.4.4 Transmittance
1.4.5 Diffraction
1.4.6 Interference
1.4.7 Dispersion
1.5 Fundamentals of Crystallography
1.6 Molecular Motions and Vibration
1.7 Electron Imaging
1.8 Magnetism in Solids
1.8.1 Magnetic Terminology
1.8.2 Types of Magnetism
1.9 Dielectric Constant and Dielectric Loss: Definition
References

Chapter 2: X-Ray Diffraction
2.1 Introduction
2.2 Bragg's law
2.3 Von Laue Treatment: Laue's Equation
2.4 Experimental Techniques
2.5 Geometry and Instrumentation
2.6 Standard X-ray Diffraction Pattern
2.7 Applications
References

Chapter 3: Raman Spectroscopy
3.1 Introduction
3.2 Classical theory of Raman Scattering
3.3 Quantum theory of Raman Scattering
3.4 Raman Spectrometer
3.5 Special Techniques
3.6 Resonance Raman Scattering
3.7 Applications
References

Chapter 4: X-ray Spectroscopic Techniques
4.1 X-Ray Absorption Spectroscopy (XAS)
4.1.1 Introduction
4.1.2 Basic Principle of XAS
4.1.3 Experimental Aspects
4.1.4 Experimental Setup
4.1.5 Example and Analysis
4.2 X-ray Photoelectron Spectroscopy (XPS)
4.2.1 Introduction
4.2.2 Basic Principles
4.2.3 Energy Referencing
4.2.4 Instrumentation
4.2.5 XPS Spectra and its Features
4.2.6 Example and Analysis
4.3 Auger Electron Spectroscopy (AES)
4.3.1 Introduction
4.3.2 Interactions of Electrons with Matter
4.3.3 Competition between X-ray and Auger Electron Emission
4.3.4 Auger Process
4.3.5 Kinetic Energy of Auger Electrons
4.3.6 Instrumentation
4.3.7 Auger Spectra
4.3.8 Examples and Analysis
References

Chapter 5: Electron Microscopy
5.1 Elastic Scattering
5.2 Inelastic Scattering
5.3 Family of Electron Microscopes
5.4 Electron diffraction
5.5 The X-ray Microscope
5.6 Transmission Electron Microscope
5.7 Scanning Electron Microscope
5.8 Scanning Transmission Electron Microscope
5.9 Examples and Analysis
References

Chapter 6: Magnetic Measurement Techniques
6.1 Introduction
6.2 Extraction Method
6.3 Vibrating Sample Magnetometer (VSM)
6.4 Advantages and Disadvantages of VSM
6.5 SQUID Magnetometer
6.6 Applications, Illustration and Analysis
References

Chapter 7: Infrared Spectroscopy
7.1 Introduction
7.2 Theoretical Concepts
7.3 Instrumentation and Sampling methods
7.4 FTIR
7.5 Examples, Illustrations and Analysis
References

Chapter 8: Dielectric Measurements
8.1 Introduction
8.2 Dependence of Dielectric properties on Frequency
8.3 Dependence of Dielectric properties on Temperature
8.4 Dielectric Measurement Techniques
8.5 Examples, Illustrations and Analysis
References