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Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications - Manuel Servin

Fringe Pattern Analysis for Optical Metrology

Theory, Algorithms, and Applications

By: Manuel Servin, J. Antonio Quiroga, Moises Padilla

eBook | 30 May 2014 | Edition Number 1

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Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Industry Reviews

"I recommend this book for several reasons: it provides great insights into the principles and practical applications of classical and advanced interferometry in optical metrology, and it presents the main algorithms for recovering the modulating phase from single or multiple patterns." (Optics & Photonics, 8 October 2014)

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