Atomic Force Microscopy in Adhesion Studies

By: J. Drelich (Editor), Kash L. Mittal (Editor)

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eText | 1 October 2005 | Edition Number 1

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Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, an