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Analytical Techniques for Thin Films : Treatise on Materials Science and Technology, Vol. 27 - K. N. Tu

Analytical Techniques for Thin Films

Treatise on Materials Science and Technology, Vol. 27

By: K. N. Tu (Editor), R. Rosenberg (Editor)

eText | 22 October 2013 | Edition Number 1

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Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.
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