Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

By: Ch Sateesh Kumar, Ram Krishna, M. Muralidhar Singh

Write A Review

Paperback | 29 November 2024 | Edition Number 1

At a Glance

Paperback
144 Pages

Dimensions(cm)
15.6 x 23.4 x 1.1

Paperback

RRP $103.00

$91.75

11%OFF

or 4 interest-free payments of $22.94 with

or

Ships in 3 to 5 business days

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:

Covers material characterization techniques and the development of advanced characterization technology
Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
Discusses advanced material characterization technology in the microstructural and property characterization fields
Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

Shipping

	Standard Shipping	Express Shipping
Metro postcodes:	$9.99	$14.95
Regional postcodes:	$9.99	$14.95
Rural postcodes:	$9.99	$14.95

Orders over $89.00 qualify for free shipping.

How to return your order

At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.

Additional postage charges may be applicable.

Defective items

If there is a problem with any of the items received for your order then the Booktopia Customer Care team is ready to assist you.

For more info please visit our Help Centre.

More in Spectrum Analysis

Fundamentals of Spectroscopy - Sheldon Davis

$279.75

14%
OFF

Gas Chromatography-Mass Spectrometry for Omics Applications

Hardcover

$500.75

Xafs for Everyone

Hardcover

RRP $200.00

$120.99

40%
OFF

Analytical Impedance Spectroscopy : Basics and Applications - Devendra , Varanasi, India) Kumar

$Springer Optical Sciences : Complementary Tools for in-situ sizing and morphology evaluation of nanoclusters and fractal nanoparticles aggregates - Stefano di Stasio$