Silicon Quantum Integrated Circuits

Cover -- Title Page -- Preface -- Table of Contents -- 1. Introduction -- 1.1 Microelectronics and Optoelectronics -- 1.2 From Microelectronics to Nanoelectronics -- 1.3 Self ... ordering -- 1.4 Further Reading -- 2. Material Science -- 2.1 Growth and Preparation Methods (MBE, CVD, Implantation, Annealing) -- 2.2 Segregation and Diffusion of Dopants and Alloy Materials -- 2.3 Lattice Mismatch and its Implication on Critical Thickness and Interface Structure -- 2.4 Virtual Substrates and Strain Relaxation -- 2.5 Further Reading -- 3. Resum??e of Semiconductor Physics -- 3.1 Quantum Mechanics -- 3.2 The Band Structure of Semiconductors -- 3.3 The Concentration of Carriers in a Semiconductor -- 3.4 Electronic Transport in a Semiconductor -- 3.5 Low Dimensional Physics: Quantum Wires and Dots -- 3.6 Lattice Vibrations and Phonons -- 3.7 Optical Properties of Semiconductors -- 3.8 The Continuity Equations Including Recombination and Generation -- 3.9 Further Reading -- 4. Realisation of Potential Barriers -- 4.1 Depletion layer and built in voltage -- 4.2 d-Doping and n-i-p-i Structures -- 4.3 Heterointerfaces (type I, type II), Abruptness and Height of Barriers -- 4.4 Influence of Strain on Bandstructure -- 4.5 Band Alignment of Strained SiGe -- 4.6 Further Reading -- 5. Electronic Device Principles -- 5.1 The p-n Junction -- 5.2 The Silicon Bipolar Transistor -- 5.3 Metal Oxide Semiconductor Field Effect Transistors MOSFETs -- 5.4 Further Reading -- 6. Heterostructure Bipolar Transistors -- HBTs -- 6.1 Trade-off between current gain and speed -- 6.2 The High Speed SiGe HBT -- 6.3 The Linear Graded Profile -- 6.4 SiGe HBT Device Performance -- 6.5 Further Reading -- 7. Hetero Field Effect Transistors (HFETs) -- 7.1 Vertical Heterojunction MOSFETs -- 7.2 Strained-Si CMOS -- 7.3 Metal-Gated MOSFETs -- 7.4 Modulation Doped Field Effect Transistors (MODFETs) -- 7.5 Further Reading -- 8. Tunneling Phenomena -- 8.1 Tunnel Diodes -- 8.2 Resonant Tunnelling -- 8.3 Real Space Transfer (RST) Devices -- 8.4 Single Electron Transistors and Coulomb Blockade -- 8.5 Further Reading -- 9. Optoelectronics -- 9.1 Photonic Devices -- 9.2 The Quantum Cascade Laser -- 9.3 Further Reading -- 10. Integration -- 10.1 The CMOS Inverter and MOS Memory Circuits -- 10.2 Silicon Process Technology -- 10.3 CMOS -- 10.4 Heterolayer Integration Issues -- 10.5 Bipolar and HBT Fabrication Processes -- 10.6 BiCMOS -- 10.7 Strained-Si CMOS -- 10.8 The System on a Chip -- 10.9 Fault Tolerant Architectures -- 10.10 Further Reading -- 11. Outlook -- A. List of variables -- B. Physical Properties of Important Materials at 300K.