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X-Ray Multiple-Wave Diffraction : Theory and Application - Chang Shih-Lin

X-Ray Multiple-Wave Diffraction

Theory and Application

Hardcover Published: 24th June 2004
ISBN: 9783540211969
Number Of Pages: 436

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X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two­ or higher-dimensional structures, like 2-d and 3-d crystals and even quasi­ crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in­ volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X­ ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure­ ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver­ sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.

Introductionp. 1
Elements of X-ray physics and crystallographyp. 13
Diffraction geometryp. 31
Experimental techniquesp. 43
Kinematical theory of X-ray diffractionp. 71
Dynamical theory of X-ray diffractionp. 89
Theoretical approachesp. 143
Dynamical diffraction properties and behaviorsp. 223
Applicationsp. 299
Table of Contents provided by Blackwell. All Rights Reserved.

ISBN: 9783540211969
ISBN-10: 3540211969
Series: Springer Series in Solid-State Sciences
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 436
Published: 24th June 2004
Publisher: Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
Country of Publication: DE
Dimensions (cm): 23.4 x 15.6  x 2.54
Weight (kg): 0.81

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