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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures : Springer Tracts in Modern Physics - Martin Schmidbauer

X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Springer Tracts in Modern Physics

Hardcover

Published: 9th January 2004
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This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

A Brief Introduction to the Topicp. 1
Basic Principles of X-Ray Diffuse Scattering from Mesoscopic Structuresp. 7
Experimental Optimizationp. 69
A Model System: LPE SiGe/Si(001) Islandsp. 95
Dynamical Scattering Effects at Grazing Incidence Conditionsp. 127
Characterizations of Quantum Dotsp. 139
Characterizations of Interface Roughnessp. 165
A: Appendixp. 187
Indexp. 199
Table of Contents provided by Blackwell. All Rights Reserved.

ISBN: 9783540201793
ISBN-10: 3540201793
Series: Springer Tracts in Modern Physics
Audience: Tertiary; University or College
Format: Hardcover
Language: English
Number Of Pages: 204
Published: 9th January 2004
Publisher: Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
Country of Publication: DE
Dimensions (cm): 23.5 x 15.5  x 1.91
Weight (kg): 0.49