Almost all recent developments in nature and materials sciences are based on the investigation and understanding of nano-scaled properties of matter. Many methods have been developed to characterise samples on the nano-scale and have been optimised over the last years. The most outstanding advancements over many orders of magnitude have been achieved in photon based methods for scattering, diffraction and spectroscopy, in particular with the use of X-ray radiation. The parameter to describe the quality of an X-ray source is the brilliance. It determines the resolving power of X-ray scattering and diffraction experiments and is a measure of the number of photons travelling through a particular area with at a well-defined divergence of the beam and fixed photon energy spread. At modern 3rd generation X-ray sources synchrotron radiation sources or X-ray lasers the brilliance is extraordinary high as compared to earlier X-ray sources, leading to a currently unprecedented quality in X-ray data. This fact has been recognized world wide and consequently, many large scale X-ray sources are under construction or have recently become operational. Thus, in the future synchrotron based X-ray experiments will become more available for scientists to carry out research at the nano-scale. In this book the new developments in X-ray diffraction and scattering methods will be presented. High resolution X-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometre range to micrometers. We provide an overview of current diffraction and scattering methods available at modern synchrotron sources. Bulk and interface investigations of solid and liquid matter will be discussed and illustrated with current research examples. The important characteristics of the sources, experimental set up and new detector developments will be presented. Future exploitation of X-ray free electron lasers for diffraction applications will also be considered.
"This book is a splendid collection of chapters by well-known experts in the field of synchrotron x-ray diffraction. It is refreshing to see a diffraction-only version of x-ray physics because there are many more books available on x-ray spectroscopy. The chapters correspond almost exactly to a complete list of beamlines at one of our present-day facilities, so I recommend it wholeheartedly to students embarking on research at one of the world's synchrotron laboratories."
-Prof. Ian Robinson, University College London, UK
"Synchrotron sources and synchrotron x-ray scattering techniques have undergone explosive growth in the last decade. It is therefore very timely to have this new collection of up-to-date reviews of the various types of x-ray scattering experiments being carried out at synchrotron facilities by experts in the field."
-Prof. Sunil K. Sinha, University of California San Diego, USA
"This book is an ideal textbook for graduate and undergraduate students in order to learn the state-of-the-art techniques from simple diffraction experiments to short-pulse free electron laser applications. I will certainly use this book for my lectures on x-ray physics."
-Prof. Metin Tolan, Technische Universitaet Dortmund, Germany
"There are a few synchrotron radiation sources scattered around the world that produce incredibly intense beams of x-rays. With some loss in intensity, the beams can be made coherent, too. These sources make possible a wide range of investigations into the nature of matter on an atomic level. This book is an up-to-date collection of research done by well-known experts at these facilities. There are 11 chapters devoted to various research areas dealing with solids and liquids, including small angle x-ray scattering, reflectivity at liquid interfaces, x-ray diffraction at extreme conditions (low temperatures and/or high pressures), and synchrotron tomography."
-Albert C. Claus, Loyola University Chicago, Illinois, USA
Audience: Tertiary; University or College
Number Of Pages: 414
Published: 26th February 2015
Publisher: Pan Stanford Publishing Pte Ltd
Country of Publication: SG
Dimensions (cm): 22.9 x 15.2 x 3.18
Weight (kg): 0.84
Edition Number: 1