World Society Studies; 3

By: M. H. Loretto, Loretto, Michael Loretto

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Paperback | 31 December 1993 | Edition Number 2

At a Glance

Paperback
284 Pages

Edition Type
Revised

Dimensions(cm)
24.13 x 16.51 x 1.91

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The microstructure of materials controls many of their important physical, mechanical and electrical properties. In order to understand and control these properties it is essential to assess microstructure at a resolution down to atomic level. This second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis, used to examine these microstructures, available today.
The text provides detailed coverage of both fundamental principles and practical aspects of the many electron beam techniques that have been developed. These include: transmission electron microscopy, scanning transmission electron microscopy, scanning electron microscopy, conventional and convergent electron diffraction, Auger electron spectroscopy, electron energy loss spectroscopy and electron probe microanalysis techniques.
The importance of understanding the operation of the equipment and of the simple theory underlying the significance of the data is emphasized. This emphasis is becoming increasingly important as computer solutions of data and computer control of equipment are tending to obscure the understanding of the analysis of data and of the operation of the equipment.
Written for researchers, senior undergraduates and graduates in material science, solid state physicists and chemists as well as practitioners of electron beam analysis, its well organized presentation serves to put the various techniques into perspective by examining similarities and differences.

Industry Reviews

Reviews of the 1st edition: A very readable text ... well illustrated with simplified diagrams and experimental examples. - Journal of Testing and Evaluation; A very useful manual introducing techniques for the determination of both microscopic and crystallographic structures. - Journal of Metals; This volume provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis, used to examine these microstructures to atomic level. [...] The book will be useful to researchers, senior undergraduates and graduates in materials science, solid state physicists and chemists as well as practitioners of electron beam analysis -o Diamond and Structural Carbon News -d September 1994

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You Can Find This Book In

Non-Fiction Engineering & Technology Technology in General Nanotechnology Science Physics Mechanical Engineering & Materials Materials Science Testing of Materials Other Technologies & Applied Sciences Applied Optics Laser Technology & Holography

Electronics & Communications Engineering Electronics Engineering Electronic Devices & Materials

Preface
Acknowledgements
Introduction to electron beam instruments	p. 1
Electron-specimen interactions	p. 21
Layout and operational modes of electron beam instruments	p. 43
Interpretation of diffraction information	p. 85
Analysis of micrographs in TEM, STEM, HREM and SEM	p. 143
Interpretation of analytical data	p. 197
Appendix A The reciprocal lattice	p. 233
Appendix B Interplanar distances and angles in crystals. Cell volumes. Diffraction group symmetries	p. 238
Appendix C Kikuchi maps, standard diffraction patterns and extinction distances	p. 243
Appendix D Stereomicroscopy and trace analysis	p. 252
Appendix E Tables of X-ray and EELS energies	p. 254
Index	p. 263
Table of Contents provided by Blackwell. All Rights Reserved.

World Society Studies; 3

At a Glance

Paperback

Industry Reviews

Shipping

How to return your order

Defective items

You Can Find This Book In

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