Unified Methods for VLSI Simulation and Test Generation : Kluwer International Series in Engineering and Computer Science - Kwang-Ting (Tim) Cheng

Unified Methods for VLSI Simulation and Test Generation

By: Kwang-Ting (Tim) Cheng, Vishwani D. Agrawal

Hardcover | 30 June 1989

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ISBN: 9780792390251

ISBN-10: 0792390253

Series: Kluwer International Series in Engineering and Computer Science

Published: 30th June 1989

Format: Hardcover

Language: English

Number of Pages: 164

Audience: General Adult

Publisher: Springer Nature B.V.

Country of Publication: US

Dimensions (cm): 24.77 x 16.51 x 1.27

Weight (kg): 0.41

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