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Testing Static Random Access Memories : Defects, Fault Models and Test Patterns - Said Hamdioui

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Hardcover

Published: 31st March 2004
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Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed.
Features:
-Fault primitive based analysis of memory faults,
-A complete framework of and classification memory faults,
-A systematic way to develop optimal and high quality memory test algorithms,
-A systematic way to develop test patterns for any multi-port SRAM,
-Challenges and trends in embedded memory testing.

From the reviews:

"Static random access memories (SRAMs) enjoy a strategic position in the microelectronic industry. ... This book concentrates on the study of fault modeling, testing and test strategies for SRAMs. ... The book provides a well-written coverage in the area of single-, two- and n-port SRAM testing, fault modeling, and simulation. It is well-organized and very timely. ... The book promises to make valuable contribution to the education of graduate students ... . I highly recommend this book ... ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)

Preface
Acknowledgements
Symbols and notations
Introductoryp. 1
Introductionp. 3
Semiconductor memory architecturep. 17
Space of memory faultsp. 37
Preparation for circuit simulationp. 65
Testing single-port and two-port SRAMsp. 85
Experimental analysis of two-port SRAMsp. 87
Tests for single-port and two-port SRAMsp. 105
Testing restricted two-port SRAMsp. 135
Testing p-port SRAMsp. 147
Experimental analysis of p-port SRAMsp. 149
Tests for p-port SRAMsp. 161
Testing restricted p-port SRAMsp. 175
Trends in embedded memory testingp. 185
Bibliographyp. 197
Simulation results for two-port SRAMsp. 205
Simulation results for three-port SRAMsp. 213
Indexp. 219
Table of Contents provided by Blackwell. All Rights Reserved.

ISBN: 9781402077524
ISBN-10: 1402077521
Series: Frontiers in Electronic Testing
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 221
Published: 31st March 2004
Publisher: Springer-Verlag New York Inc.
Country of Publication: US
Dimensions (cm): 23.5 x 15.5  x 1.27
Weight (kg): 1.15