This volume aims to clarify those techniques which use elementary particles as probes for gathering information about the compositional details of surfaces. For each technique, the book provides a description of the physical principle involved, the method of operation, the nature of information derived, the range of application, and the advantages and disadvantages of the currently used techniques. These are in turn grouped according to the nature of the incident radiation: electrons, photons, ions, or neutral particles. This state-of-the-art information will be useful for materials scientists, surface physicists and surface chemists.
`Words like "magnum opus", or "Herculean task", spring to mind when coming to describe this book.
The book is well structured.
The book is aimed at those in surface science who wish to know more about other techniques and also at those outside the field wishing to gain some knowledge of surface analysis. In both areas it succeeds admirably. It is also an indispensable addition to any academic or industrial library as a reference volume.''
Journals of Material Chemistry Issue 4 July 1991
`an extensive presentation of the many methods available for determining the composition of surfaces ... In a phenomenological and clear way it gives an instructive introduction.
Nuclear Instruments and Methods in Physics Research B61 (1991)
`the book is well written and is particularly recommended as a source book for those who would like to broaden their knowledge in their knowledge in the field of surface analysis and for those giving courses on this topic.
Trends in analytical chemistry, vol. 11, no. 2
Introduction; Resumè of physical principles; Instrumentation; Electron excitation: AES and SAM; Electron excitation: ELS, CEELS, and HREELS; Electron excitation: SXAPS, AEAPS, and DAPS; Electron excitation: IPES; Electron excitation: CLS and EIL; Electron excitation: ESD and ESDIAD; Photon excitation: XPS and XAES; Photon excitation: UPS and SRPS; Photon excitation: RAIRS and SERS; Ion excitation: AES and PAES; Ion excitation: INS and MQS; Ion
excitation: IBSCA and GDOS; Ion excitation: ISS; Ion excitation: SSIMS; Ion excitation: SNMS and GDMS; Neutral excitation: FABMS; High field excitation: IETS; High field excitation: APFIM; High field excitation: STM
and STS; Thermal excitation: TDS.
Series: Monographs on the Physics and Chemistry of Materials
Number Of Pages: 716
Published: 30th August 1990
Publisher: Oxford University Press
Country of Publication: GB
Dimensions (cm): 24.4 x 16.2
Weight (kg): 1.22