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Structure and Imperfections in Amorphous and Crystalline Silicon Dioxide - R. A. B. Devine

Structure and Imperfections in Amorphous and Crystalline Silicon Dioxide

By: R. A. B. Devine (Editor), J.-P. Duraud (Editor), E. Dooryhée (Editor)

Hardcover Published: 18th May 2000
ISBN: 9780471975366
Number Of Pages: 528

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Structure and Imperfections in Amorphous and Crystalline Silicon Dioxide Edited by R. A. B. Devine, University of New Mexico, USA J.-P. Duraud, ESRF, Grenoble, France and E. Dooryhï½e, ESRF, Grenoble, France Silicon dioxide is one of the most common naturally occurring materials. Its applications range from nuclear waste storage to optical fibre communications to silicon microelectronics. Experts from America, Europe and Japan have written chapters covering both the amorphous and the crystalline phases of the material with particular reference to its structure and defects. The book is divided into four sections: Topological Models for the Crystalline and Amorphous Phases Electronic Structure Macroscopic and Point Defects Processing and Applications of Crystalline and Amorphous Phases Engineers, researchers and postgraduate students of materials science, physics and engineering will all find this an extremely useful addition to their libraries.

Contributors

Preface

Part I Topological Models for the Crystalline and Amorphous Phases

(a) Description of the Atomic Arrangement in SiO_2 Polymorphs

Chapter 1 The Topology of Silica Networks (by L. W. Hobbs, C. E. Jesurum and B. Berger)

Chapter 2 Low-Pressure Crystalline Phases of SiO_2 (by G. Dolino)

Chapter 3 Theoretical Investigations of the Structure of Amorphous SiO_2 at Elevated Pressure (by L. Stixrude)

(b) Experimental Analysis of SiO_2 Atomic Networks

Chapter 4 Nuclear Magnetic Resonance as a Structural Probe of SiO_2 (by R. Dupree)

Chapter 5 Neutron and X-Ray Scattering Studies of Vitreous Silica (by A. C. Wright and R. N. Sinclair)

Part II Electronic Structure of the Si-O_2 Bond and the Extended Network

(a) Calculations and Modelling of the Electronic Structure

Chapter 6 Molecules as a Basis for Modeling the Force Field of Silica (by G. V. Gibbs, F. C. Hill, M. B. Boisen, Jr, and R. T. Downs)

Chapter 7 First Principles Calculation of the Electronic Structures of Crystalline and Amorphous Forms of SiO_2 (by W. Y. Ching)

Chapter 8 The Electronic Structure of Silica Using Ab Initio Pseudopotentials (by J. R. Chelikowsky and N. Binggeli)

(b) Experimental Analysis of the Electronic Structure

Chapter 9 X-Ray Absorption Near Edge Structures of SiO_2 (by F. Jollet)

Chapter 10 Electron Energy Loss Structures of SiO_2 (by M. Gautier-Soyer)

Part III Macroscopic and Point Defects

Chapter 11 Theory of Electronic and Structural Properties of Point Defects in SiO_2 (by A. H. Edwards, W. B. Fowler and J. Robertson)

Chapter 12 Radiation-Induced Defects and Electronic Modification (by P. Paillet, J. L. Leray and H. J. von Bardeleben)

Chapter 13 Transient Defects and Electronic Excitation (by N. Itoh, A. M. Stoneham and K. Tanimura)

Chapter 14 Radiation-Induced Defects and Structural Modifications (by E. Dooryhee, J.-P. Duraud and R. A. B. Devine)

Part IV Processing and Applications of Crystalline and Amorphous Phases

Chapter 15 Quartz Oscillators (by J. R. Vig)

Chapter 16 Science and Technology of Silica Lightguides for Telecommunications (by C. R. Kurkjian and D. M. Krol)

Chapter 17 Microstructure, Surface Chemistry, and Properties of Silica Gels (by C. J. Brinker, W. L. Warren and S. Wallace)

Index

ISBN: 9780471975366
ISBN-10: 0471975362
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 528
Published: 18th May 2000
Country of Publication: GB
Dimensions (cm): 23.6 x 15.8  x 3.13
Weight (kg): 0.87
Edition Number: 1

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