| Basic Aspects of Atomic Ordering in III-V Semiconductor Alloys | |
| Introduction | p. 1 |
| CuPt-B Atomic Ordering | p. 5 |
| Bandgap Anomaly and CuPt-B Ordering | p. 5 |
| Growth Conditions Dependence of CuPt-B Ordering | p. 8 |
| Bond-Length Difference | p. 13 |
| Substrate Orientation Dependence | p. 14 |
| Degree of Ordering | p. 20 |
| TP-A and CuPt-A Atomic Ordering | p. 22 |
| TP-A Ordering | p. 22 |
| CuPt-A Ordering | p. 27 |
| Ordering Mechanisms | p. 29 |
| CuPt-B, TP-A, and CuPt-A Ordering | p. 29 |
| Famatinite, Chalcopyrite, and CuAu-I Ordering | p. 35 |
| Concluding Remarks | p. 36 |
| References | p. 38 |
| The Nature and Origin of Atomic Ordering in Group III-V Antimonide Semiconductor Alloys | |
| Introduction | p. 45 |
| Atomic Ordering in Group III-V Antimonide Semiconductors Alloys | p. 49 |
| Nature of Ordering | p. 49 |
| Origins of Atomic Ordering in Semiconductor Alloys | p. 63 |
| CuPt-Type Atomic Ordering | p. 63 |
| Antiphase Superlattice in MBE GaAsSb Grown at High Temperature | p. 85 |
| CuAu-I Type Ordering in Layers Grown on (110) Substrates | p. 89 |
| CuAu-I and Chalcopyrite Ordering in Layers Grown in (001) Substrates | p. 90 |
| Conclusions | p. 90 |
| References | p. 92 |
| Effects of the Surface on CuPt Ordering During OMVPE Growth | |
| Introduction | p. 99 |
| Review of the Ordering Processes | p. 101 |
| Effects of Surfaces | p. 102 |
| Temperature | p. 103 |
| Partial Pressure of the P Precursor | p. 104 |
| Effects of Surfactants | p. 107 |
| Tellurium | p. 108 |
| Antimony | p. 109 |
| Summary | p. 113 |
| References | p. 115 |
| X-Ray Diffraction Analysis of Ordering in Epitaxial III-V Alloys | |
| Introduction | p. 119 |
| Overview of X-Ray Diffraction Theory | p. 120 |
| Kinematical Diffraction Theory | p. 120 |
| Dynamical Diffraction Theory | p. 123 |
| Structure Factor | p. 125 |
| Long-Range Order | p. 126 |
| Long-Range Order Parameter | p. 126 |
| Structure Factor of an Ordered Crystal | p. 127 |
| Measurement of the Long-Range Order Parameter | p. 130 |
| Reciprocal Space Mapping of Ordered Domains | p. 132 |
| Short-Range Order | p. 134 |
| Short-Range Order Diffuse Intensity and Order Parameters | p. 134 |
| Coexistence of Long- and Short-Range Order | p. 139 |
| Measurement of SRO in Epitaxial III-V Alloys | p. 139 |
| Lateral Compositional Modulation | p. 142 |
| Summary | p. 144 |
| References | p. 144 |
| Surface Morphology and Formation of Antiphase Boundaries in Ordered (GaIn)P--A TEM Study | |
| Introduction | p. 147 |
| Transmission Electron Microscopy | p. 149 |
| Experimental | p. 151 |
| Results and Discussion | p. 151 |
| Summary | p. 161 |
| References | p. 162 |
| X-Ray Characterization of CuPt Ordered III-V Ternary Alloys | |
| Introduction | p. 165 |
| Results from TED and TEM Studies | p. 167 |
| X-Ray Diffraction Measurements | p. 168 |
| Structural Model and Diffraction Theory | p. 170 |
| Structural Model | p. 170 |
| Diffraction Theory | p. 172 |
| Effect of the Atomic Displacements | p. 175 |
| Examples of Data Analyses | p. 180 |
| Single-Variant Ordered Films | p. 180 |
| Double-Variant Ordered Films | p. 183 |
| Determination of the Order Parameter | p. 190 |
| Summary | p. 192 |
| References | p. 192 |
| Diffraction and Imaging of Ordered Semiconductors | |
| Introduction | p. 195 |
| TEM | p. 195 |
| Epitaxy | p. 199 |
| Ordering | p. 200 |
| Ordered Semiconductors | p. 202 |
| GaInP | p. 202 |
| GaInAs | p. 210 |
| CuInSe[subscript 2] | p. 212 |
| Dynamical Diffraction | p. 214 |
| Bloch Waves | p. 215 |
| Eigenfunctions | p. 216 |
| Crystal Potential | p. 217 |
| Analysis | p. 219 |
| Zincblende | p. 220 |
| CuPt-B Ordering | p. 220 |
| Lamellar Ordering | p. 227 |
| CuAu-I Ordering | p. 228 |
| Chalcopyrite Ordering | p. 230 |
| Conclusions | p. 231 |
| References | p. 231 |
| X-Ray Analysis of the Short-Range Order in the Ordered-Alloy Domains of Epitaxial (Ga,In)P Layers by DAFS of Superlattice Reflections | |
| Introduction | p. 235 |
| Specimens | p. 236 |
| Experiment | p. 237 |
| Quantitative DAFS Analysis | p. 239 |
| Discussion | p. 253 |
| Conclusions | p. 255 |
| References | p. 255 |
| Ballistic Electron Emission Microscopy and Spectroscopy Study of Ordering-Induced Band Structure Effects in Ga[subscript 0.52]In[subscript 0.48]P | |
| Introduction | p. 257 |
| BEEM Technique | p. 260 |
| Experimental Set-Up | p. 262 |
| Results and Analysis | p. 263 |
| Conclusions | p. 269 |
| References | p. 269 |
| Cross-Sectional Scanning Tunneling Microscopy as a Probe of Local Order in Semiconductor Alloys | |
| Introduction | p. 271 |
| References | p. 282 |
| The Physics of Tunable Disorder in Semiconductor Alloys | |
| Introduction | p. 283 |
| Ordering Induced Band Gap Reduction and Valence Band Splitting | p. 285 |
| Band Gap Reduction | p. 285 |
| Valence Band Splitting | p. 290 |
| Ordering Induced Optical Anisotropy or Polarization | p. 292 |
| Linear Polarization | p. 292 |
| Circular (Spin) Polarization | p. 295 |
| Ordering Induced Changes in Effective Mass | p. 297 |
| Reflectance Difference Spectroscopy Study of Ordered Structure | p. 301 |
| Statistical Aspects of Spontaneous Ordering | p. 304 |
| Band Offset Between Ordered GaInP and GaAs | p. 308 |
| Novel Superlattices--Orientational Superlattices | p. 312 |
| Extrinsic Effects in Ordered GaInP | p. 316 |
| Conclusions | p. 321 |
| References | p. 322 |
| Spectroscopic Study of the Interface and Band Alignment at the GaInP(Partially Ordered)/GaAs Heterojunction under High Pressure and High Magnetic Field | |
| Introduction | p. 328 |
| Background | p. 330 |
| Effect of Ordering on Band Structure of GaInP and Its Band Offset with GaAs | p. 331 |
| Effect of Pressure on Band Structure of GaAs and GaInP | p. 333 |
| Effect of Magnetic Field on Free and Bound Carriers | p. 335 |
| Sample Preparation and Characterization | p. 339 |
| S Series | p. 339 |
| T Series | p. 339 |
| V Series | p. 341 |
| Experimental Details | p. 342 |
| Experimental Results | p. 344 |
| Band Offsets in Sample Showing Upconversion (T Series) | p. 344 |
| Band Offsets in GaInP Sample Which Shows No Upconversion at Ambient Pressure (S1) | p. 347 |
| Band Alignment and Emission from po-GaInP/GaAs/poGaInP Quantum Wells (V Series) | p. 354 |
| Discussion | p. 361 |
| Conclusions | p. 362 |
| References | p. 363 |
| Polarization Effects in the (Electro)absorption of Ordered GaInP and Their Device Applications | |
| Introduction | p. 365 |
| Ordering Induced Effects on the Optical Transitions in GaInP | p. 366 |
| Crystallographic and Electronic Structure | p. 366 |
| Polarization Anistropy of the Optical Properties | p. 367 |
| Polarization dependent Electro-Absorption | p. 370 |
| Franz-Keldysh Effect | p. 370 |
| Experimental Setup | p. 371 |
| Comparison Between Absorption and Electro-Absorption | p. 372 |
| Fundamental Band Gap | p. 373 |
| Backfolded States--Fingerprints of Ordering | p. 376 |
| Discussion of the Results | p. 377 |
| Polarization-Sensitive Devices | p. 379 |
| Polarization Detector | p. 382 |
| Polarization Switch | p. 383 |
| Conclusions and Outlook | p. 387 |
| References | p. 388 |
| Phonons in Ordered Semiconductor Alloys | |
| Introduction | p. 391 |
| Raman Scattering Studies | p. 394 |
| Raman Scattering form the (001) Surface | p. 397 |
| Micro-Raman Scattering | p. 400 |
| Infrared Studies | p. 414 |
| IR Reflection | p. 414 |
| IR Transmission | p. 417 |
| Phonons in Double Variant Ordered GaInP[subscript 2] | p. 418 |
| Conclusions | p. 420 |
| References | p. 420 |
| Effects of Ordering on Physical Properties of Semiconductor Alloys | |
| Introduction | p. 423 |
| Dependence on the Degree of LRO | p. 425 |
| Energy Level Shift and Splitting | p. 427 |
| X-Ray Structure Factor | p. 431 |
| Electric Field Gradient | p. 434 |
| Coupling of Ordering with Strain | p. 437 |
| Optical Anistropy in Ordered Alloys | p. 439 |
| Spin Polarization in Ordered Alloys | p. 440 |
| Effects of Stacking Faults | p. 443 |
| Summary | p. 448 |
| References | p. 448 |
| Polarization Charges at Spontaneously Ordered (In,Ga)P/GaAs Interfaces | |
| Background | p. 451 |
| Band Offsets | p. 452 |
| Piezoelectric Polarization of (In,Ga)P | p. 452 |
| C-V Experiments | p. 453 |
| Outline | p. 454 |
| Carrier Distribution at Interfaces | p. 454 |
| C-V Method | p. 454 |
| n-Type GaAs/(In,Ga)P/GaAs Heterojunctions | p. 455 |
| p-Type GaAs/(In,Ga)P/GaAs Heterojunctions | p. 457 |
| Effect of Spontaneous Ordering | p. 458 |
| GaAs-on-(In,Ga)P Interface | p. 458 |
| (In,Ga)P-on-GaAs Interface | p. 459 |
| Band Offsets and Interfacial Charges | p. 461 |
| Simulation of Carrier Distributions at Heterointerfaces | p. 461 |
| GaAs-on-(In,Ga)P Interface | p. 462 |
| (In,Ga)P-on-GaAs Interface | p. 463 |
| Order-Induced Polarization Charges | p. 464 |
| Conclusions | p. 465 |
| References | p. 467 |
| Author Index | p. 469 |
| Subject Index | p. 471 |
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