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Solid Sample Analysis : Direct and Slurry Sampling Using Gf-AAS and Etv-Icp - Ulrich Kurfurst

Solid Sample Analysis

Direct and Slurry Sampling Using Gf-AAS and Etv-Icp

By: Ulrich Kurfurst (Editor)

Paperback Published: 22nd September 2011
ISBN: 9783642082900
Number Of Pages: 427

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The analysis of solid materials by introducing solid test sampies directly into the graphite furnace of an atomic absorption spectrometer must be regarded as a powerful analytical approach. Even if it is - of course - not the "ultimate method". After three decades of development, the instrumentation and the methodology are available to apply solid sampling successfully for the analysis of almost every material. Moreover, several tasks cannot be solved using other analytical methods as neatly as they can using direct solid sampling. The conventional methods work more or less satisfactorily, so why do we sug­ gest applying solid sampling much more extensively than it is today? To begin with, the features pointed out time and again should be named: Rapidity of the analytical procedure, low susceptibility to analyte loss or contamination, very smallquantities can be analyzed, and expenditure on instrumentation and per­ sonell is also low. These properties are examined and the necessary conditions are discussed (Chapter 1) as are the analytical tasks (Chapter 6) for which use of this method is advantageous. Other features that are often overlooked are just as important: The simplicity of the analytical procedures allows the analyst to main­ tain an intimate relationship with the original scientific task that has to be solved with the analysis. Furthermore, the considerable reduction of working place haz­ ards and pollution by avoiding the use of chemical reagents must nowadays be assessed as a feature as important as the others.

Characteristics of Solid Sampling Using Graphite Furnace.- General Aspects of the Graphite Furnace Solid Sampling Method.- Direct Solid Sampling with Graphite Furnace Atomic Absorption Spectrometry (ET-AAS).- Solid Sampling by Electrothermal Vaporization-Inductively Coupled Plasma-Atomic Emission and - Mass Spectrometry (ETV-ICP-AES/-MS).- Slurry Sampling into the Electrothermal Atomizer.- Advantageous Fields of Application for Solid Sampling Analysis.

ISBN: 9783642082900
ISBN-10: 3642082904
Audience: General
Format: Paperback
Language: English
Number Of Pages: 427
Published: 22nd September 2011
Publisher: Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
Country of Publication: DE
Dimensions (cm): 23.39 x 15.6  x 2.31
Weight (kg): 0.62

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