Reliability is an essential concept in mathematics, computing, research, and all disciplines of engineering, and reliability as a characteristic is, in fact, a probability. Therefore, in this book, the author uses the statistical approach to reliability modelling along with the MINITAB software package to provide a comprehensive treatment of modelling, from the basics through advanced modelling techniques.the difference in the analysis of lifetimes for repairable versus non-repairable systems and whether repair truly "renews" the system
The book begins by presenting a thorough grounding in the elements of modelling the lifetime of a single, non-repairable unit. Assuming no prior knowledge of the subject, the author includes a guide to all the fundamentals of probability theory, defines the various measures associated with reliability, then describes and discusses the more common lifetime models: the exponential, Weibull, normal, lognormal and gamma distributions. She concludes the groundwork by looking at ways of choosing and fitting the most appropriate model to a given data set, paying particular attention to two critical points: the effect of censored data and estimating lifetimes in the tail of the distribution.
The focus then shifts to topics somewhat more difficult:
methods for dealing with system with reliability characteristic specified for more than one component or subsystem
the effect of different types of maintenance strategies
the analysis of life test data
The final chapter provides snapshot introductions to a range of advanced models and presents two case studies that illustrate various ideas from throughout the book.
"This is a lucid introduction to many important ideas in reliability. In describing the various models and techniques the author includes plenty of practical advice about their usuage. Frequent and well-developed examples illustrate and extend the techniques and there are two brief case studies at the end of the book. By studying these examples carefully, the student will learn much about the difficult art of formulating useful models." --Biometrics, June 2000