"Complete dependence on semiconductor vendors' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. <br> <br> The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers." <br> <br> Sponsored by: <br> IEEE Components, Packaging, and Manufacturing Technology Society, IEEE Solid-State Circuits Council/Society.
List of Contributors.
List of Acronyms.
Basics of Nonvolatile Semiconductor Memory Devices (G. Groeseneken, et al.).
Floating Gate Planar Devices (H. Lin & R. Ramaswami).
Floating Gate Nonplanar Devices (H. Wegener & W. Owen).
Floating Gate Flash Devices (M. Gill & S. Lai).
SONOS Nonvolatile Semiconductor Memories (M. White & F. Libsch).
Reliability and NVSM Reliability (Y. Hsia & V. Tyree).
Radiation Tolerance (G. Messenger).
Procurement Considerations (D. Sweetman).
Bibliography (W. Brown).
Series: IEEE Press Series on Microelectronic Systems
Number Of Pages: 590
Published: 29th October 1997
Country of Publication: US
Dimensions (cm): 25.9 x 18.1
Weight (kg): 1.05
Edition Number: 1