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Noncontact Atomic Force Microscopy

By: Roland Wiesendanger, E. Meyer, S. Morita

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Hardcover | 24 July 2002

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460 Pages

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23.5 x 15.88 x 2.54

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$329.00

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Industry Reviews

"This book gives a comprehensive overview of the state-of-the-art of this dynamic force microscopy technique in 20 chapters, each written by experts in the field. It covers the theoretical basis, as well as applications to semiconducting surfaces, ionic crystals, metal oxides, and organic molecular systems including thin films, polymers, and nucleic acids ... There are unsolved questions about the mechanisms responsible for atomic resolution but, as this well-written book displays, there has been tremendous progress in basic understanding of the technique and fascinating new applications continue to arise ... With an increased understanding of NC-AFM, as demonstrated in this book, we are certain to see further progress in the near future." --Materials Today

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You Can Find This Book In

Non-Fiction Science Science in General Scientific Equipment Microscopy Astronomy, Space & Time Physics Materials & States of Matter Engineering & Technology Technology in General Nanotechnology Mathematics

Mechanical Engineering & Materials Materials Science Instruments & Instrumentation Engineering Engineering Measurement & Calibration Scientific Standards

Introduction	p. 1
AFM in Retrospective	p. 1
Present Status of NC-AFM	p. 4
Future Prospects for NC-AFM	p. 8
References	p. 10
Principle of NC-AFM	p. 11
Basics	p. 11
Relation to the Scanning Tunneling Microscope (STM)	p. 11
Atomic Force Microscope (AFM)	p. 15
Operating Modes of AFMs	p. 18
Scanning Speed, Signal Bandwidth and Noise	p. 20
The Four Additional Challenges Faced by AFM	p. 20
Jump-to-Contact and Other Instabilities	p. 21
Contribution of Long-Range Forces	p. 21
Noisein theImagingSignal	p. 22
Non-MonotonicImaging Signal	p. 22
Frequency-Modulation AFM (FM-AFM)	p. 22
Experimental Setup	p. 22
Applications	p. 26
Relation between Frequency Shift and Forces	p. 29
Generic Calculation	p. 29
Frequency Shift for a Typical Tip-Sample Force	p. 32
Calculation of the Tunneling Current for Oscillating Tips	p. 33
Noise in Frequency-Modulation AFM	p. 34
Generic Calculation	p. 34
Noisein theFrequencyMeasurement	p. 34
Optimal Amplitude for Minimal Vertical Noise	p. 38
A Novel Force Sensor Based on a Quartz Tuning Fork	p. 39
Quartz Versus Silicon as a Cantilever Material	p. 39
Benefits in Clamping One of the Beams (qPlus Configuration)	p. 40
Conclusion and Outlook	p. 41
References	p. 43
Semiconductor Surfaces	p. 47
Instrumentation	p. 47
Three-Dimensional Mapping of Atomic Force	p. 48
Control ofAtomic Force	p. 52
Imaging Mechanisms for Si(100)2×1 and Si(100)2×1: H	p. 55
Surface Strain on an Atomic Scale	p. 58
Low Temperature Image of Si(100) Clean Surface	p. 60
Mechanical Control ofAtomPosition	p. 61
Atom Identification Using Covalent Bonding Force	p. 65
Charge Imaging with Atomic Resolution	p. 68
Mechanical Atom Manipulation	p. 74
References	p. 76
Bias Dependence of NC-AFM Images and TunnelingCurrent Variations on Semiconductor Surfaces	p. 79
Experimental Conditions	p. 79
Bias Dependence of NC-AFM Images for Si(111)7×7	p. 80
MechanismofInvertedAtomicCorrugation	p. 81
NC-AFM Imaging and Tunneling Current	p. 84
NC-AFM Images for Ge/Si(111)	p. 88
Concluding Remarks	p. 91
References	p. 92
Alkali Halides	p. 93
Introduction	p. 93
Experimental Techniques	p. 93
Relevant Forces	p. 94
Imaging of Single Crystals	p. 95
Sample Preparation	p. 95
Atomic Corrugation	p. 96
Imaging of Defects	p. 97
Mixed Alkali Halide Crystals	p. 98
Imaging of Thin Films	p. 98
Preparation of Thin Films	p. 99
Atomic Resolutionat Low-Coordinated Sites	p. 100
Radiation Damage	p. 101
Metallization and Bubble Formation in CaF₂	p. 101
Monatomic Pits in KBr	p. 102
Dissipation Measurements	p. 103
Material and Site-Specific Contrast	p. 104
Using Damping for Distance Control	p. 105
References	p. 106
Atomic Resolution Imaging on Fluorides	p. 109
Experimental Techniques	p. 110
Tip Instabilities	p. 111
Flat Surfaces	p. 115
Step Edges	p. 119
References	p. 122
Atomically Resolved Imaging of a NiO(001) Surface	p. 125
Antiferromagnetic Nickel Oxide	p. 125
ExperimentalConsiderations	p. 127
Morphology ofthe Cleaved Surface	p. 128
Atomically Resolved Imaging UsingNon-CoatedandFe-CoatedSiTips	p. 129
Short-Range Magnetic Interaction	p. 130
Analysis ofthe Cross-Section	p. 131
Conclusion	p. 133
References	p. 134
Atomic Structure, Order and Disorder on High Temperature Reconstructed -Al₂O₃(0001)	p. 135
TheCleanSurface	p. 137
Defect Formation upon Water Exposure	p. 139
Self-Organized Formation of Nanoclusters	p. 141
References	p. 143
NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides	p. 147
Introduction	p. 147
1×1 to 1×3 Phase Transition of TiO₂(100)	p. 148
Surface Reconstructions of TiO₂(110)	p. 151
The 1×2 Reconstruction of SnO₂(110)	p. 154
Imaging Thin Film Alumina: NiAl(110)-Al₂O₃	p. 155
Growth of Cu and Pd on -Al₂O₃(0001)- <$$>	p. 158
A Short-Range-Ordered Overlayer of K on TiO₂(110)	p. 160
Conclusions	p. 162
References	p. 163
Atoms and Molecules on TiO₂(110) and CeO₂(111) Surfaces	p. 167
Background	p. 167
Brief Description of Experiments	p. 168
Surface Structures of TiO₂(110)	p. 169
Adsorbed Atoms and Molecules on TiO₂(110)	p. 170
Carboxylate Ions on TiO₂(110)	p. 170
Hydrogen Adatoms on TiO₂(110)	p. 172
Fluctuation ofAcetate Ions on TiO₂(110)	p. 173
Surface Structures of CeO₂(111)	p. 175
Conclusions	p. 178
References	p. 179
NC-AFM Imaging of Adsorbed Molecules	p. 183
NucleicAcidBasesonaGraphiteSurface	p. 183
Double-StrandedDNAonaMicaSurface	p. 187
Alkanethiol on a Au(111) Surface	p. 189
References	p. 191
Organic Molecular Films	p. 193
AFM Imaging of Molecular Films	p. 194
Fullerenes	p. 195
AlkanethiolSAMs	p. 198
Ferroelectric Molecular Films	p. 200
Surface Potential Measurements	p. 204
Technical Developments in NC-AFM Imaging ofMolecules	p. 209
Concluding Remarks	p. 211
References	p. 212
Single-Molecule Analysis	p. 215
Introduction	p. 215
Molecules and Surface	p. 216
Experimental Methods	p. 217
Alkyl-Substituted Carboxylates	p. 218
Numerical Simulation ofPropiolate Topography	p. 221
Sphere-Substrate Force	p. 223
Sphere-Carboxylate Force	p. 223
Cluster-Substrate Force	p. 224
Cluster-Carboxylate Force	p. 224
Simulated Topography	p. 224
Fluorine-Substituted Acetates	p. 226
Conclusions and Perspectives	p. 229
References	p. 230
Low-Temperature Measurements: Principles, Instrumentation, and Application	p. 233
Introduction	p. 233
Microscope Operation at Low Temperatures	p. 234
Drift	p. 234
Noise	p. 236
Instrumentation	p. 237
Van der Waals Surfaces	p. 239
HOPG(0001)	p. 240
Xenon	p. 241
Nickel Oxide	p. 242
Semiconductors	p. 244
f(z) Curves on Specific Atomic Sites	p. 244
Tip-Dependent Atomic Scale Contrast	p. 246
Tip-Induced Relaxation	p. 248
Magnetic Force Microscopy at Low Temperatures	p. 249
MFM Data Acquisition	p. 249
Domain Structure of La_0.7Ca_0.3MnO_3-	p. 250
Vortices on YBa₂Cu₃O_7-	p. 251
Conclusions	p. 252
References	p. 253
Theory of Non-Contact Atomic Force Microscopy	p. 257
Introduction	p. 257
Cantilever Dynamics	p. 259
Theoretical Simulation of NC-AFM Images	p. 262
Non-Contact Atomic Force Microscopy Images ofDynamic Surfaces	p. 267
Effect of Tip on Image for the Si(100)2×1: H Surface	p. 270
Effect of Tip on Surface Structure Change and its Relation to Dissipation	p. 274
Conclusion and Outlook	p. 277
References	p. 278
Chemical Interaction in NC-AFM on Semiconductor Surfaces	p. 279
Introduction	p. 279
First-Principles Calculation of Tip-Surface Chemical Interaction	p. 280
Simulation of NC-AFM Images	p. 281
Simulations on Various Surfaces	p. 284
Tip-Induced Surface Relaxation on the GaAs(110) Surface	p. 286
Vertical Scan Over an As Atom	p. 286
Vertical Scan Over a Ga Atom	p. 288
RelevancetoNear-Contact STM Observations	p. 291
Tip-Induced Surface Atomic Processes and EnergyDissipation in NC-AFM	p. 293
Image Contrast on GaAs(110) for a Pure Si Tip: Distance Dependence	p. 293
Effect of Tip Morphology on NC-AFM Images	p. 297
Image Contrast for the Ga/Si Tip	p. 299
Image Contrast for the As/Si Tip	p. 301
Conclusion	p. 302
References	p. 303
Contrast Mechanisms on InsulatingSurfaces	p. 305
Introduction	p. 305
Model ofAFM and Main Forces	p. 306
Tip-Surface Setup	p. 306
Forces	p. 307
Simulating Scanning	p. 313
TheSurface	p. 313
TheTip	p. 314
Tip-Surface Interaction	p. 317
Modelling Oscillations	p. 319
Generating a Theoretical Surface Image	p. 320
Applications	p. 320
The Calcium Fluoride (111) Surface	p. 322
Calcite: Surface Deformations During Scanning	p. 336
Studying Surface and Defect Properties	p. 341
Conclusions	p. 343
References	p. 344
Analysis of Microscopy and Spectroscopy Experiments	p. 349
Introduction	p. 349
BasicPrinciples	p. 349
Experimental Setup	p. 349
Origin ofthe Frequency Shift	p. 351
Calculation ofthe FrequencyShift	p. 352
Frequency Shift for Conservative Tip-Sample Forces	p. 354
Simulation of NC-AFM Images	p. 355
Experimental NC-AFM Images of van der Waals Surfaces 355
BasicPrinciplesoftheSimulationMethod	p. 358
Applications ofthe Simulation Method	p. 360
Dynamic Force Spectroscopy	p. 362
Determining Forces fromFrequencies	p. 362
Analysis ofTip-Sample Interaction Forces	p. 366
Conclusion	p. 367
References	p. 368
Theory of Energy Dissipation into Surface Vibrations	p. 371
Introduction	p. 371
Possible Dissipation Mechanisms	p. 372
Adhesion Hysteresis	p. 372
Stochastic Dissipation	p. 375
Other Mechanisms	p. 375
Brownian Particle MechanismofEnergy Dissipation	p. 375
Brownian Particle	p. 375
Fluctuation-Dissipation Theorem	p. 377
Oscillating Tip as a Brownian Particle	p. 378
Energy Dissipated Per Oscillation Cycle	p. 380
Nonequilibrium Considerations for NC-AFM Systems	p. 382
Preliminary Remarks	p. 382
Mixed Quantum-Classical Representation	p. 383
Equation ofMotion for the Tip	p. 385
Estimation ofDissipation Energies in NC-AFM	p. 388
Comparison with STM	p. 391
Conclusions and Future Directions	p. 392
References	p. 393
Measurement of Dissipation Induced by Tip-Sample Interactions	p. 395
Introduction	p. 395
Experimental Aspects of Energy Dissipation	p. 396
ExperimentalMethods	p. 398
ApparentEnergyDissipation	p. 399
Velocity-DependentDissipation	p. 404
Electric-Field-MediatedJouleDissipation	p. 405
Magnetic-Field-MediatedJouleDissipation	p. 408
Magnetic-Field-MediatedDissipation	p. 409
Brownian Dissipation	p. 412
Hysteresis-Related Dissipation	p. 413
Magnetic-Field-Induced Hysteresis	p. 413
Hysteresis Due to Adhesion	p. 415
Hysteresis Due to Atomic Instabilities	p. 416
DissipationImagingwithAtomicResolution	p. 419
DissipationSpectroscopy	p. 426
Conclusion	p. 429
References	p. 429
Index	p. 433
Table of Contents provided by Publisher. All Rights Reserved.

Noncontact Atomic Force Microscopy

At a Glance

Hardcover

Industry Reviews

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How to return your order

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You Can Find This Book In

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