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Nanoscale Characterisation of Ferroelectric Materials : Scanning Probe Microscopy Approach - Marin Alexe

Nanoscale Characterisation of Ferroelectric Materials

Scanning Probe Microscopy Approach

By: Marin Alexe (Editor), Alexei Gruverman (Editor)

Hardcover

Published: 1st May 2004
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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

From the reviews:





"The aim of this book is to present recent advances in nanoscale characterization of electrical, mechanical and optical properties of ferroelectric materials made possible due to the use of the SPM techniques. ... will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. ... The book succeeds in being informative, balanced and intelligent ... . The references at the end of each chapter also make the book consistently informative and steadily rewarding." (Current Engineering Practice, Vol. 47 (3), 2004-2005)

Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces
Challenges in the Analysis of the Local Piezoelectric Response
Electrical Characterization of Nanoscale Ferroelectric Structures
Nanoscale Optical Probes of Ferroelectric Materials
Scanning Probe Dielectric Microscopy for Investigation of Ferroelectric Polarization
Nanoscale Piezoelectric Phenomena in Epitaxial PZT Thin Films
Scanning Probe Microscopy of Ferroelectric Domains near Phase Transitions
Nanodomain Engineering in Ferroelectric Crystals Using High Voltage Atomic Force Microscopy
Nanoinspection of Dielectric and Polarization at Inner and Outer Interfaces in PZT Thin Films
Table of Contents provided by Publisher. All Rights Reserved.

ISBN: 9783540206620
ISBN-10: 3540206620
Series: NanoScience and Technology
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 282
Published: 1st May 2004
Publisher: Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
Country of Publication: DE
Dimensions (cm): 23.5 x 15.5  x 1.91
Weight (kg): 0.67