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Nanometer Technology Designs : High-Quality Delay Tests - Nisar Ahmed

Nanometer Technology Designs

High-Quality Delay Tests

Paperback Published: 14th December 2011
ISBN: 9781441945594
Number Of Pages: 281

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Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

Introduction to path delay and transition delay fault models and test methods.- At-speed test challenges for nanometer technology designs.- Low-cost tester friendly design-for-test techniques.- Improving test quality of current at-speed test methods.- Functionally untestable fault list generation and avoidance.- Timing-based ATPG for screening small delay faults.- Faster-than-at-speed test considering IR-drop effects.- IR-drop tolerant at-speed test pattern generation and application.

ISBN: 9781441945594
ISBN-10: 1441945598
Audience: General
Format: Paperback
Language: English
Number Of Pages: 281
Published: 14th December 2011
Country of Publication: US
Dimensions (cm): 23.39 x 15.6  x 1.6
Weight (kg): 0.42

Earn 472 Qantas Points
on this Book