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Multi-Chip Module Test Strategies : Frontiers in Electronic Testing - Yervant Zorian

Multi-Chip Module Test Strategies

Frontiers in Electronic Testing

By: Yervant Zorian (Editor)

Hardcover Published: May 1997
ISBN: 9780792399209
Number Of Pages: 167

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MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

Foreword
MCM Testing Background: Fundamentals of MCM Testing and Design-For-Testability
Die Level Testing: Known Good Die
Substrate Testing: A Survey of Test Techniques for MCM Substrates
Smart Substrate MCMs
Electron Beam Probing - A Solution for MCM Test and Failure Analysis
Module Level Test: MCM Test Strategy Synthesis from Chip Test and Board Test Approaches
Designing `Dual Personality' IEEE 1149.1 Compliant Multi-Chip Modules
An Effective Multi-Chip BIST Scheme
MCM Test Applications: Design-For-Test in a Multiple Substrate Multichip Module
A Test Methodology for High Performance MCMs
Module Level Diagnosis: A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules
Multichip Module Diagnosis by Product-Code Signatures
Simulation Techniques for MCMs: Simulation Techniques for the Manufacturing Test of MCMs
MCM Test Economics: Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die
Index
Table of Contents provided by Publisher. All Rights Reserved.

ISBN: 9780792399209
ISBN-10: 079239920X
Series: Frontiers in Electronic Testing
Audience: General
Format: Hardcover
Language: English
Number Of Pages: 167
Published: May 1997
Publisher: Springer
Country of Publication: NL
Dimensions (cm): 27.31 x 20.96  x 1.91
Weight (kg): 0.57