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Modern Developments and Applications in Microbeam Analysis : Mikrochimica ACTA. Supplement, - G. Love

Modern Developments and Applications in Microbeam Analysis

Mikrochimica ACTA. Supplement,

By: G. Love (Editor), W. A. Nicholson (Editor), A. Armigliato (Editor)

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The European Microanalysis Society held its Fifth Workshop in Torquay in May 1997. This volume includes the revised presentations of 12 tutorials and 50 papers from leading experts in the fields covering the following main topics: X-ray spectrometry, analytical electron microscopy, surface studies, bulk analysis, fundamental parameters.

Recent Developments in Instrumentation for X-Ray Microanalysisp. 1
High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectorsp. 11
Efficiency Calibration of a Si(Li) Detector by EPMAp. 21
Wavelength-Dispersive X-Ray Spectrometryp. 29
X-Ray Spectrum Processing and Multivariate Analysisp. 37
Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscopep. 49
On the Spatial Resolution in Analytical Electron Microscopyp. 59
Contamination in Analytical Electron Microscopy and in ALCHEMIp. 65
Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloyp. 73
Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materialsp. 77
Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigationsp. 83
Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br.I) Nano- and Microcrystalsp. 87
Electron Energy-Loss Near-Edge Structure of Alumina Polymorphsp. 93
SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablationp. 97
Surface Characterisation and Modification of YBCO Thin Films by STMp. 101
Quantitative Near-Surface Microanalysis and Depth Profiling by EPMAp. 109
EPMA Sputter Depth Profiling. Part I: Theory and Evaluationp. 125
EPMA Sputter Depth Profiling. Part II: Experimentp. 133
Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMSp. 141
Quantitative EDS Analysis of SiO[subscript 2]/Al[subscript 2]O[subscript 3]/TiO[subscript 2] Multilayer Filmsp. 149
Surface Ionization of Thin Films on Substrates: Measurement and Simulationp. 155
Comparison of Different Methods to Characterize Thin a-Si:H Filmsp. 163
EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporationp. 171
Analysis of Thin Films with Slightly Rough Boundariesp. 177
Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour Deposition Methodp. 181
EPMA Determination of Arsenic Excess in Low Temperature Grown GaAsp. 187
EPMA of Melted UO[subscript 2] Fuel Rods from the Phebus-FP Reactor Accident Experimentp. 191
Steels, Carbon Concentration, and Microhardnessp. 201
Determination of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methodsp. 207
EPMA of the Composition of Opal-Based Nanostructured Materialsp. 211
NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavasp. 219
Compositional X-Ray Maps of Metamorphic and Magmatic Mineralsp. 227
Chemical Mapping of Weathering Stages in Lateritesp. 237
Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides and Sulpharsenides: Problems, Solutions, and Applicationsp. 247
Composition of 15-17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgiump. 253
Potassium Migration in Silica Glass During Electron Beam Irradiationp. 269
X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samplesp. 273
Environmental SEM and X-Ray Microanalysis of Biological Materialsp. 283
Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEMp. 295
The Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beamp. 301
Standardless Analysisp. 307
A New Technique for Standardless Analysis by EPMA-TWIXp. 317
Stopping Power Factor for Standardless QEPMAp. 321
On the Measurement of the Backscattering Coefficient for Low Energy Electronsp. 325
Monte Carlo Simulations of Edge Artefacts in MULSAM Imagesp. 333
Assessment of the Inelastic Scattering Model in Monte-Carlo Simulationsp. 341
A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programsp. 351
Fractals and BaTiO[subscript 3]-Ceramic Microstructure Analysisp. 365
Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energiesp. 371
Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ionsp. 379
The Standards, Measurements and Testing Programme (SMT), the European Support to Standardisation, Measurements and Testing Projectsp. 387
Table of Contents provided by Blackwell. All Rights Reserved.

ISBN: 9783211831069
ISBN-10: 3211831061
Series: Mikrochimica ACTA. Supplement,
Audience: General
Format: Paperback
Language: English
Number Of Pages: 392
Publisher: SPRINGER VERLAG GMBH
Country of Publication: AT
Dimensions (cm): 27.94 x 20.96  x 2.13
Weight (kg): 0.92