Microprobe Characterization of Optoelectronic Materials

Name: Microprobe Characterization of Optoelectronic Materials
Brand: Taylor & Francis Inc
Price: 882.99 AUD
Availability: BackOrder

By: Juan Jimenez

Write A Review

Hardcover | 15 November 2002 | Edition Number 1

At a Glance

Hardcover
730 Pages

Dimensions(cm)
22.9 x 15.2

Hardcover

RRP $1,050.00

$882.99

16%OFF

or 4 interest-free payments of $220.75 with

or

Available for Backorder. We will order this from our supplier however there isn't a current ETA.

Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

Shipping

	Standard Shipping	Express Shipping
Metro postcodes:	$9.99	$14.95
Regional postcodes:	$9.99	$14.95
Rural postcodes:	$9.99	$14.95

Orders over $79.00 qualify for free shipping.

How to return your order

At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.

Additional postage charges may be applicable.