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Materials Interfaces : Atomic-level Structure and Properties - D. Wolf

Materials Interfaces

Atomic-level Structure and Properties

By: D. Wolf (Editor), Sidney Yip (Editor)

Hardcover Published: 31st October 1992
ISBN: 9780412412707
Number Of Pages: 716

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This reference work, prepard by investigators from several distinct segments of the interface research community, focuses attention on the opportunities that exist in an exceedingy active area of materials research. In spite of the technological importance of materials interfaces, basic understanding of their atomic-level structure and properties is still very much limited and it is now recognized that an interdisciplinary approach which also combines theory, experiment and computer simulation holds the greatest promise for advances. By bringing together critical reviews on various types of solid interfaces, this book provides a reference on the study of interfacial structure and phenomena, which emphasizes the commonalities of different systems and the value of atomic-level insights that can be gained by an integrated approach. The introductory chapters highlight the common aspects of many interface problems. The main body of the book is divided into four parts. The first two sections are devoted to bulk interfaces, particularly grain boundaries, and to semi-bulk and thin-film interfaces. Parts 3 and 4 deal with interfacial properties of direct concern in practical applications.

`The book is a landmark in mapping the present status of a broad field, the essential unity of which was obscured until this collection of essays pointed it out. Materials interfaces will be a standard reference for some time to come.' Euro Materials

Contributors. Introduction. Atomic-level geometry of crystalline interfaces; D. Wolf. Experimental investigation of internal interfaces in solids; D.N. Seidman. Bulk interfaces. Part I: Bulk interfaces. Correlation between the structure and energy of grain boundaries in metals; D. Wolf, K.L. Merkle. Grain and interphase boundaries in ceramics and ceramic composites; M.G. Norton, C.B. Carter. Special properties of E grain boundaries; G. Palumbo, K.T. Aust. Grain boundary structure and migration; D.A. Smith. Role of interfaces in melting and solid-state amorphization; S.R. Phillpot, S. Yip, P.R. Okamoto, D. Wolf. Wetting of surfaces and grain boundaries; D.R. Clarke, M. Gee. Part II: Semi-bulk and thin-film interfaces. Structural, electronic and magnetic properties of thin films and superlattices; A. Continenza, C.Li, A.J. Freeman. Surfaces and interfaces as studied by scanning-tunneling microscopy; R. Hamers. Epitaxy of semiconductor thin films; J. Batstone. Phase behavior of monolayers; S.G.J. Mochrie, D. Gibbs, D.M. Zehner. Elastic and structural properties of superlattices; M. Grimsditch, I.K. Schuller. Computer simulation of the elastic behavior of interface materials; D. Wolf, J. Jasczak. Interfaces within intercalation compounds; M.S. Dresselhaus, G. Dresselhaus. Nanophase materials: structure-property correlations; R.W. Siegel. Part III: Role of interface chemistry. Interfacial segregation, bonding and reactions; C.L. Briant. Physics and chemistry of segregation at internal interfaces; R. Kirchheim. Atomic resolution study of solute-atom segregation at grain boundaries: experiments and Monte Carlo simulations; S.M. Foiles, D. Seidman. Amorphization by interfacial reaction; W.L. Johnson. Relationship between structural and electronic properties of metal-semiconductor interfaces; R. Tung. Electronic properties of semiconductor-semiconductor interfaces and their control using interface chemistry; D.W. Niles, G. Margaritondo. Microscopic nature of metal-polymer interfaces; P.S. Ho, B.D. Silverman, S-L. Chiu. Part IV: Fracture behavior. Tensile strength of interfaces; A.S. Argon, V. Gupta. Microstructure and fracture resistance of metal/ceramic interfaces; A.G. Evans, M. Ruhle. Role of interface dislocations and surface ledges in the work of adhesion; D. Wolf, J. Jaszczak. Microstructural and segregation effects in the fracture of polycrystals; D.J. Srolovitz, W. Yang.

ISBN: 9780412412707
ISBN-10: 0412412705
Audience: Tertiary; University or College
Format: Hardcover
Language: English
Number Of Pages: 716
Published: 31st October 1992
Publisher: Chapman and Hall
Country of Publication: GB
Dimensions (cm): 27.9 x 21.0  x 5.08
Weight (kg): 1.49