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Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization - Sascha Sadewasser

Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization

By: Sascha Sadewasser (Editor), Thilo Glatzel (Editor)

Paperback Published: 4th January 2019
ISBN: 9783030092986
Number Of Pages: 521

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This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.

In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics.

It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.


ISBN: 9783030092986
ISBN-10: 3030092984
Series: Springer Series in Surface Sciences
Audience: General
Format: Paperback
Language: English
Number Of Pages: 521
Published: 4th January 2019
Publisher: SPRINGER VERLAG GMBH
Dimensions (cm): 23.39 x 15.6  x 2.82
Weight (kg): 0.76

Earn 472 Qantas Points
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