This text, the first of its kind, delivers a systematically organized introduction to the theory and practice of yield prediction. The book addresses the economic need for accurate yield prediction, and clarifies the important role it plays in the semiconductor industry.
Yield. Fault Probability. Effect of Defect Sizes on the Fault Probability. Counting Techniques. Yield Equations. Defect Density and Scaling Rules. Yield Prediction. Yield With Redundancy. A Yield Comparison. Productivity. Conclusion. References.
Series: Electronic Materials & Devices Library
Number Of Pages: 108
Published: 31st July 1992
Publisher: Artech House Publishers
Country of Publication: US
Dimensions (cm): 22.9 x 15.2
Weight (kg): 0.3