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In-Situ Microscopy in Materials Research : Leading International Research in Electron and Scanning Probe Microscopies :  Leading International Research in Electron and Scanning Probe Microscopies - Pratibha L. Gai

In-Situ Microscopy in Materials Research : Leading International Research in Electron and Scanning Probe Microscopies

Leading International Research in Electron and Scanning Probe Microscopies

By: Pratibha L. Gai (Editor)

Hardcover Published: December 2009
ISBN: 9780792399896
Number Of Pages: 336

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This book presents an authoritative account of innovative interdisciplinary in-situ microscopy developments and applications in this rapidly expanding and fascinating field in material and surface sciences and technologies. Direct studies of dynamic materials close to their natural reaction state to obtain fundamental insights into their processes and properties have always been the goal of material scientists including physicists, chemists, ceramicists, heritage conservation scientists and biologists. This has been realized by the extraordinary pioneering developments by internationally renowned scientists from the USA, Japan, Europe and Australia, described in this book. The book fulfills a strong need for an informative account of the different in-situ microscopy methods and will be especially useful both for young scientists, undergraduates and graduates, embarking on research of materials, and practising materials scientists working in areas as diverse as semiconductor science and technology, integrated circuits, ceramics, superconductors, heterogeneous catalysis, biological processes, polymers and cultural heritage conservation, and describes what can happen to live materials as they react. The book contains thirteen chapters covering in-situ developments and applications in environmental-SEM, field emission-SEM, LEEM, reflection EM, UHV-TEM and HVEM, direct atomic-scale probing of gas molecule-solid interactions with environmental-HVEM, atomic level HVEM with very high temperature sample holders, electron diffraction, scanning tunneling microscopy (STM) including for atomic-scale fabrication of surfaces and high temperature UHV-STM, electron holography and Lorentz microscopy.

List of Contributors
Foreword
Preface
In-Situ Applications of Low Energy Electron Microscopy (LEEM)p. 1
Environmental Scanning Electron Microscopyp. 13
ESEM Development and Application in Cultural Heritage Conservationp. 45
Intrinsic Point Defect Clustering in Si: A Study by HVEM and HREM In-Situ Electron Irradiationp. 63
In-Situ Observation and Quantitative Analysis of Electromigration Void Dynamicsp. 93
Environmental High Resolution Electron Microscopy (EHREM) in Materials Sciencep. 123
In-Situ Transmission Electron Microscopy of Thin Film Growthp. 149
HREM In-Situ Experiment at Very High Temperaturesp. 173
In-Situ REM and TEM Studies of Homo and Hetero-Epitaxy on Si Surfacesp. 201
Atomic-Scale Fabrication of Metal Surfaces by Adsorption and Chemical Reactionp. 225
High Temperature Dynamic Behavior of Silicon Surfaces Studied by Scanning Tunneling Microscopy (STM)p. 263
Dynamic Observation of Vortices in Superconductors Using Electron Wavesp. 283
TEM Studies of Some Structurally Flexible Solids and Their Associated Phase Transformationsp. 301
Author Indexp. 331
Subject Indexp. 333
Table of Contents provided by Blackwell. All Rights Reserved.

ISBN: 9780792399896
ISBN-10: 0792399897
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 336
Published: December 2009
Publisher: Springer
Country of Publication: NL
Dimensions (cm): 24.77 x 17.15  x 2.54
Weight (kg): 0.79