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Impact of Electron and Scanning Probe Microscopy on Materials Research : NATO Science Series E: - David G. Rickerby

Impact of Electron and Scanning Probe Microscopy on Materials Research

NATO Science Series E:

By: David G. Rickerby (Editor), Giovanni Valdre (Editor), Ugo Valdre (Editor)

Paperback Published: 30th September 1999
ISBN: 9780792359401
Number Of Pages: 489

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The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Table of contents
Preface
Participants photos
List of Contributors
List of Participants
The impact of electron microscopy on materials research
Microstructural design and tayloring of advanced materials
Nanostructured materials
Characterization of heterophase transformation interfaces by highresolution transmission electron microscope techniques
High resolution scanning electron microscopy observations of nanoceramics
Metal-ceramic interfaces studied with high resolution transmission electron microscopy
Z-contrast scanning transmission electron microscopy
Electron energy loss spectrometry in the electron microscope -
Introduction
Electron energy loss spectrometry in the electron microscope -
EELS in the context of solid state spectroscopies
Electron energy loss spectrometry in the electron microscope -
Interfaces and localised spectrometry
EELS near edge structures
Application to intermetallic alloys and other materials
Surface chemistry and microstructure analysis of novel technological materials
Convergent beam electron diffraction
New developments in scanning probe microscopy
Low-energy scanning electron microscope for nanolithography
Application of low voltage Scanning Electron Microscopy and energy dispersive x-ray spectroscopy
Environmental SEM and related applications
History of the environmental SEM and basic design concepts
Environmental SEM and related applications
Environmental SEM and related applications
Gas interactions and gaseous amplification
ESEM image contrast and applications to wet organic materials
Advanced electron and scanning probe microscopy on dental and medical materials research
Correlative microscopy and probing in materials science
Epilogue
Subject index
Table of Contents provided by Publisher. All Rights Reserved.

ISBN: 9780792359401
ISBN-10: 0792359402
Series: NATO Science Series E:
Audience: General
Format: Paperback
Language: English
Number Of Pages: 489
Published: 30th September 1999
Publisher: Springer
Country of Publication: NL
Dimensions (cm): 23.39 x 15.6  x 2.64
Weight (kg): 0.72