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Handbook of Nanoscopy : 2 Volume Set - Gustaaf van Tendeloo

Handbook of Nanoscopy

2 Volume Set

By: Gustaaf van Tendeloo (Editor), Dirk van Dyck (Editor), Stephen J. Pennycook (Editor)

Hardcover Published: 18th April 2012
ISBN: 9783527317066
Number Of Pages: 1450

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This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical

to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going

on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,

alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between

methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and

engineers, as well as graduate students and their lecturers.

Industry Reviews

"Undoubtedly, this is a valuable addition to any material laboratory for motivating researchers/students togain new ideas on using microscopy methods to fundamentally understand their materials and technologies."  (Nanomaterials and Energy, 19 February 2013)

 

 

 

 

General Introduction
From the Past to the Future

VOLUME I: Methods

LIGHT MICROSCOPY
Fundamentals of Light Microscopy
Optical Contrasting of Microstructures
Near-Field Optical Microscopy
X-RAY MICROSCOPY
Soft X-Ray Imaging
X-Ray Microtomography and X-Ray Topography
MAGNETIC MICROSCOPY
NMR Imaging
FIELD ION MICROSCOPY
Field Emission and Field Ion Microscopy
SCANNING POINT PROBE TECHNIQUES
Scanning Probe Microscopy
Atomic Force Microscopy
ELECTRON MICROSCOPY: STATIONARY BEAM METHODS
Transmission Electron Microscopy (TEM)
High-Resolution TEM
Aberration-Corrected High Resolution Microscopy
Electron Energy Loss Spectroscopy Imaging
Low Energy Electron Microscopy
Lorentz Microscopy
Electron Holography Methods
Electron Tomography
In-Situ TEM
Nanolab
Dynamic TEM
SCANNING BEAM METHODS
Scanning Electron Microscopy and Scanning Ion Microscopy
Focused Ion Beam Microscopy
Scanning Transmission Electron Microscopy: Z Contrast
Composition Mapping
Imaging Secondary Ion Mass Spectroscopy
IMAGE RECORDING, HANDLING AND PROCESSING
Image Recording in Microscopy
Image Processing
Statistical Parameter Estimation

VOLUME 2: Applications

Metals and Alloys
Minerals and Geological Materials
Ferroic Materials
Grain Boundaries and Structural Ceramics
Non-Periodic Structures and Amorphous Materials
Quasi-Crystalline Materials
Carbon
Polymers and Monomeric Analogs
Magnetic Materials
Small Particles
Preparation Techniques for Transmission Electron Microscopy
Catalytic Materials and Porous Materials
Nanowires and Nanotubes
Biomaterials
Complex Oxides
Energy Materials
Surfaces and Interfaces
Polymers
Semiconductors and Semiconducting Devices
Optoelectronic and Spintronics Materials

ISBN: 9783527317066
ISBN-10: 3527317066
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 1450
Published: 18th April 2012
Publisher: Wiley-VCH Verlag GmbH
Country of Publication: DE
Dimensions (cm): 244.09 x 70.25  x 176.78
Weight (kg): 3.04
Edition Number: 1

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