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Extended Defects in Semiconductors : Electronic Properties, Device Effects and Structures - D. B. Holt

Extended Defects in Semiconductors

Electronic Properties, Device Effects and Structures

Hardcover Published: 30th March 2016
ISBN: 9780521819343
Number Of Pages: 644

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The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

Industry Reviews

'This new book is ... a welcome addition, covering as it does extended defects in semiconductors from the basics to the current state-of-the-art. ... extremely readable with a clear, concise style. The presentation is classic, eschewing 'break-out boxes' and other more modern layout innovations in favour of a traditional straight text. The diagrams are equally no nonsense: simple clear line drawings, which as a result effectively convey what are sometimes complex concepts. Lots to crib from here for lecture presentations! ... In their quest to create a single book covering such a large subject area the authors have been surprisingly successful, and the result is an interesting, readable book that serves both as an excellent introduction for postgraduates and a useful reference for those in the field. ... it will no doubt become a regularly consulted reference work in every materials science library.' Chemistry World

Prefacep. xi
Semiconducting materialsp. 1
Materials development and crystal growth techniquesp. 1
Electron energy levels and energy bandsp. 10
Bonding and the crystal chemistry of semiconducting materialsp. 15
Crystal structures of the most important semiconductorsp. 20
Symmetry, Bloch waves and energy band theoryp. 27
Complex semiconductors and chemical bondingp. 38
Energy band engineeringp. 45
Materials development and materials competitionp. 60
Referencesp. 67
An introduction to extended defectsp. 73
Basic definitionsp. 74
Types of extended defect in semiconductorsp. 75
Dislocations, plastic deformation and slip systemsp. 77
Electrical effects of dislocations in semiconductorsp. 103
Plasticity of semiconductorsp. 104
Referencesp. 117
Symbolsp. 120
Characterization of extended defects in semiconductorsp. 122
Introductionp. 122
Microscopy techniquesp. 123
Light microscopyp. 123
Scanning laser beam microscopy techniquesp. 127
Electron microscopyp. 128
Transmission electron microscopyp. 130
Scanning electron microscopyp. 136
Field emission gun scanning transmission electron microscopyp. 144
X-ray topographyp. 146
Scanning probe microscopyp. 147
Rutherford backscatteringp. 154
Positron annihilation spectroscopyp. 154
Common acronyms for (micro) characterization techniquesp. 156
Referencesp. 157
Core structures and mechanical effects of extended defects specific to semiconductorsp. 163
Atomic core structure of dislocationsp. 163
Semiconductor dislocation dynamicsp. 222
Dislocations in II-VI compoundsp. 252
Plastic deformation and the microdynamical theory of plasticityp. 278
Dislocations and area defects: geometry, formation and propertiesp. 286
Epitaxial interfaces and misfit dislocationsp. 331
Dislocations and point defectsp. 345
Growth and processing induced defectsp. 357
Referencesp. 375
Symbolsp. 410
The electrical, optical and device effects of dislocations and grain boundariesp. 412
Introduction to the electrical effects of dislocations and other defects in semiconductorsp. 412
The electrical effects of the deformation of semiconductors: the Read theoryp. 425
Recombination at dislocationsp. 436
The effect of dislocations on optical absorptionp. 446
SEM EBIC microscopy of individual dislocationsp. 448
SEM CL microscopy of individual dislocationsp. 485
Scanning probe microscopy of extended defectsp. 520
Effect of dislocations on transport properties of epitaxial heterostructuresp. 522
Summary: the electrical properties of dislocationsp. 530
The electrical and luminescent effects of grain boundaries in semiconductorsp. 533
The role of defects in devicesp. 546
Device benefits of dislocations and grain boundariesp. 558
Referencesp. 572
Point defect materials problemsp. 606
Introductionp. 606
Impurity precipitationp. 606
Point defect interactionsp. 607
Phase separation and ordering in semiconducting compounds and alloysp. 610
Large-scale, grown-in spatial maldistributions of point defectsp. 611
Major persisting issuesp. 620
Referencesp. 621
Indexp. 625
Table of Contents provided by Ingram. All Rights Reserved.

ISBN: 9780521819343
ISBN-10: 0521819342
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 644
Published: 30th March 2016
Publisher: Cambridge University Press
Country of Publication: GB
Dimensions (cm): 25.0 x 18.2  x 3.5
Weight (kg): 1.22