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Electron Microscopy and Analysis, Third Edition - Peter J. Goodhew

Electron Microscopy and Analysis, Third Edition

Paperback Published: 30th November 2000
ISBN: 9780748409686
Number Of Pages: 264

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Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Acronymsp. ix
Prefacep. xi
Microscopy with light and electronsp. 1
Introductionp. 1
Methods of image formationp. 2
Pixelsp. 3
The light-optical microscopep. 4
Magnificationp. 7
Resolutionp. 8
Depth of field and depth of focusp. 12
Aberrations in optical systemsp. 14
Electrons versus lightp. 16
Questionsp. 19
Electrons and their interaction with the specimenp. 20
Introductionp. 20
Electronsp. 20
Generating a beam of electronsp. 24
Deflection of electrons--magnetic lensesp. 27
The scattering of electrons by atomsp. 29
Elastic scatteringp. 30
Inelastic scatteringp. 31
Secondary effectsp. 34
The family of electron microscopesp. 37
Questionsp. 38
Electron diffractionp. 40
The geometry of electron diffractionp. 41
Diffraction spot patternsp. 47
Use of the reciprocal lattice in diffraction analysisp. 51
Other types of diffraction patternp. 58
Questionsp. 64
The transmission electron microscopep. 66
The instrumentp. 66
Contrast mechanismsp. 76
High voltage electron microscopy (HVEM)p. 108
Scanning transmission electron microscopy (STEM)p. 110
Preparation of specimens for TEMp. 110
Questionsp. 121
The scanning electron microscopep. 122
How it worksp. 122
Obtaining a signal in the SEMp. 124
The optics of the SEMp. 131
The performance of the SEMp. 133
The ultimate resolution of the SEMp. 135
Topographic imagesp. 141
Compositional imagesp. 146
Crystallographic information from the SEMp. 149
The use of other signals in the SEMp. 153
Image acquisition, processing and storagep. 159
The preparation of specimens for examination in the SEMp. 162
Low voltage microscopyp. 164
Environmental scanning electron microscopy (ESEM)p. 166
Questionsp. 167
Chemical analysis in the electron microscopep. 169
The generation of X-rays within a specimenp. 170
Detection and counting of X-raysp. 174
X-ray analysis of bulk specimensp. 184
X-ray analysis of thin specimens in the TEMp. 193
Quantitative analysis in an electron microscopep. 196
Electron energy loss spectroscopy (EELS)p. 205
A brief comparison of techniquesp. 212
Questionsp. 213
Electron microscopy and other techniquesp. 214
Complementary imaging techniquesp. 214
Complementary analysis techniques--alternative analysis systemsp. 225
Complementary diffraction techniquesp. 233
Summaryp. 234
Questionsp. 234
Further readingp. 236
Answersp. 238
Indexp. 243
Table of Contents provided by Syndetics. All Rights Reserved.

ISBN: 9780748409686
ISBN-10: 0748409688
Audience: Professional
Format: Paperback
Language: English
Number Of Pages: 264
Published: 30th November 2000
Publisher: TAYLOR & FRANCIS
Country of Publication: GB
Dimensions (cm): 22.86 x 15.24  x 1.27
Weight (kg): 0.48
Edition Number: 3
Edition Type: New edition

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