This volume treats the different methods used in electron microbeam analysis. The volume consists of five tutorial chapters which give an overview and an in-depth analysis of a particular section of electron microbeam analysis. In these chapters the state of the art technology is described together with the major obstacles which remain and a future outlook. Further, 25 brief articles are included which form the condensed scientific information of a poster session during the 2nd workshop of the European Microbeam Analysis Society held in Dubrovnik, May 1991. In this volume there are different categories of electron microbeam analysis (Electron probe microanalysis (EPMA), electron energy loss spectrometry (EELS) and Auger electron spectroscopy (AES)) intensively linked and discussed together. The versatility in the use of electron microbeams in chemical-analytical work is emphasized. The approach is strongly inititated from a methodological point of view: How are data derived and how can methods be improved further. The reliability of the particular method comes on the first place.
The benefits to potential readers of this book is the state of the art overview which is enclosed in the tutorial papers and which are exemplified to some extent in the brief articles.
EPMA - A Versatile Technique for the Characterization of Thin Films and Layered Structures..- Quantitative EPMA of the Ultra-Light Elements Boron Through Oxygen..- Auger Microscopy and Electron Probe Microanalysis..- Quantitative X-Ray Microanalysis of Ultra-Thin Resin-Embedded Biological Samples..- Analytical and High-Resolution Electron Microscopy Studies at Metal/Ceramic Interfaces..- Quantitative Electron Probe Microanalysis of Multi-layer Structures..- Comparison of ? (?z) Curve Models in EPMA..- Quantitative Electron Probe Microanalysis: New Accurate ? (?z) Description..- A Modular Universal Correction Procedure for Quantitative EPMA..- Monte Carlo Simulation of Backscattered and Secondary Electron Profiles..- An Electron Scattering Model Applied to the Determination of Film Thicknesses Using Electron Probe Microanalysis..- Calculation of Depth Distribution Functions for Characteristic and for Continuous Radiation..- A Method for In-Situ Calibration of Semiconductor Detectors..- Background Anomalies in Electron Probe Microanalysis Caused by Total Reflection..- Automatic Analysis of Soft X-Ray Emission Spectra Obtained by EPMA..- The Scanning Very-Low-Energy Electron Microscopy (SVLEEM)..- To the Backscattering Contrast in Scanning Auger Microscopy..- Design Consideration Regarding the Use of an Accelerator on Mass Spectrometer in Ion Microanalysis..- Accurate Estimation of Uncertainties in Quantitative Electron Energy- Loss Spectrometry..- An EELS System for a TEM/STEM-Performance and Its Use in Materials Science..- Quantitative X-Ray Microanalysis of Bio-Organic Bulk Specimens..- Quantitative Analysis of (Y2O3)x (ZrO2)1-x Films on Silicon by EPMA..- EPMA of Surface Oxide Films..- Non-Destructive Determination of Ion-Implanted Impurity Distribution in Silicon by EPMA..- An Electron Spectroscopy Study of a-SiNx Films..- Electron Probe Microanalysis of Glass Fiber Optics..- Quantitative Microanalysis of Low Concentrations of Carbon In Steels..- Electron Configuration of the Valence-Conduction Band of the Mineral Wustite..- Structural Analysis of Silver Halide Cubic Microcrystals with Epitaxial or Conversion Growths by STEM-EDX..- Characterization of the Bony Matrix of the Otic Capsule in Human Fetuses by EPMA..- Overview..
Series: Mikrochimica ACTA Supplementa
Number Of Pages: 278
Publisher: SPRINGER VERLAG GMBH
Country of Publication: AT
Dimensions (cm): 27.94 x 21.59
Weight (kg): 0.68