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Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs : Microwave Library - Robert Anholt

Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs

Microwave Library

Hardcover Published: 30th November 1994
ISBN: 9780890067499
Number Of Pages: 324

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This work provides a comprehensive discussion of the bias dependence of equivalent circuit parameters for the three devices and an extensive discussion of temperature dependence. It: covers recess-etched MESFETs and self-aligned MESFETs with and without lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP lattice-matched HEMT equivalent circuits; and describes a large-signal, temperature-dependent model extractor for A1GaAs-GaAs HBTs. The book is intended for circuit designers, process and device developers and test engineers.

Physical Modeling of III-V Semiconductor Devices
How to Measure Temperature-dependent Equivalent Circuits
Self-heating in Transistors
GaAs MESFET Equivalent Circuits (Room Temperature)
Temperature-dependent MESFET Equivalent Circuits
HEMT Equivalent Circuits (Room Temperature)
Temperature-dependent HEMT Equivalent Circuits
Gate Currents in MESFETs and HEMTs
Heterojunction Bipolar Transistors
Circuit Modeling
Table of Contents provided by Publisher. All Rights Reserved.

ISBN: 9780890067499
ISBN-10: 089006749X
Series: Microwave Library
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 324
Published: 30th November 1994
Publisher: Artech House Publishers
Country of Publication: US
Dimensions (cm): 22.9 x 15.2  x 2.2
Weight (kg): 0.6

Earn 699 Qantas Points
on this Book