+612 9045 4394
Digital Systems Testing and Testable Design - Miron Abramovici

Digital Systems Testing and Testable Design

Hardcover Published: 27th September 1994
ISBN: 9780780310629
Number Of Pages: 672

Share This Book:


RRP $548.99
or 4 easy payments of $94.94 with Learn more
Ships in 7 to 10 business days

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.


How This Book Was Written.



Logic Simulation.

Fault Modeling.

Fault Simulation.

Testing For Single Stuck Faults.

Testing For Bridging Faults.

Functional Testing.

Design For Testability.

Compression Techniques.

Built-In Self-Test.

Logic-Level Diagnosis.

Self-Checking Design.

PLA Testing.

System-Level Diagnosis.


ISBN: 9780780310629
ISBN-10: 0780310624
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 672
Published: 27th September 1994
Country of Publication: US
Dimensions (cm): 25.75 x 18.55  x 4.16
Weight (kg): 1.34
Edition Number: 1