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Digital Integrated Circuit Design : The Oxford Series in Electrical and Computer Engineering - Ken Martin

Digital Integrated Circuit Design

The Oxford Series in Electrical and Computer Engineering

Hardcover Published: 1st November 1999
ISBN: 9780195125849
Number Of Pages: 560

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Working from the fundamentals of transistor-level design and building up to system-level considerations, Digital Integrated Circuit Design shows students with minimal background in electronics how to design state-of-the-art high performance digital integrated circuits. Ideal as an upper-level undergraduate text, it can also be used in first-year graduate courses and as a reference for practicing engineers.
Digital Integrated Circuit Design:
A- Presents transistor-level details first, building up to system considerations
A- Emphasizes CMOS technology but also includes in-depth explanations of designing in bipolar, BiCMOS, and GaAs technologies
A- Features modern, well-designed examples and problems
A- Covers important system-level considerations such as timing, pipelining, clock distribution, and system building blocks in detail
A- Discusses key elements of semiconductor physics, integrated circuit processing, transistor-level design, logic-level design, system-level design, testing, and more
A- Provides physical and intuitive explanations throughout
A- Emphasizes conceptual thinking and design methodology over detailed circuit analysis techniques

Preface 1. THE BASICS 1.1: Simple NMOS Logic Gates 1.2: Simple CMOS Logic Gates 1.3: Computer Simulation 1.4: Transfer Curves and Noise Margins 1.5: Gate Delays and Rise and Fall Times 1.6: Transient Response 1.7: An RC Approximation to the Transient Response of a CMOS Inverter 1.8: Summary 1.9: Bibliography 1.10: Problems 2. PROCESSING, LAYOUT, AND RELATED ISSUES 2.1: CMOS Processing 2.2: Bipolar Processing 2.3: CMOS Layout and Design Rules 2.4: Advanced CMOS Processing 2.5: Bibliography 2.6: Problems 3. INTEGRATED-CIRCUIT DEVICES AND MODELING 3.1: Simplified Transistor Modeling 3.2: Semiconductors and pn Junctions 3.3: MOS Transistors 3.4: Advanced MOS Modeling 3.5: Bipolar-Junction Transistors 3.6: SPICE-Modeling Parameters 3.7: Appendix 3.8: SPICE Simulations 3.9: Bibliography 3.10: Problems 3.11: Device Model Summary 4. TRADITIONAL MOS DESIGN 4.1: Pseudo-NMOS Logic 4.2: Pseudo-NMOS Logic Gates 4.3: Transistor Equivalency 4.4: CMOS Logic 4.5: CMOS Gate Design 4.6: SPICE Simulations 4.7: Bibliography 4.8: Problems 5. TRANSMISSION-GATE AND FULLY DIFFERENTIAL CMOS LOGIC 5.1: Transmission-Gate Logic Design 5.2: Differential CMOS Circuits 5.3: Bibliography 5.4: Problems 6. CMOS TIMING AND I/O CONSIDERATIONS 6.1: Delay of MOS Circuits 6.2: Input/Output Circuits 6.3: Bibliography 6.4: Problems 7. LATCHES, FLIP-FLOPS, AND SYNCHRONOUS SYSTEM DESIGN 7.1: CMOS Clocked Latches 7.2: Flip-flops 7.3: CMOS Flip-flops 7.4: Synchronous System Design Techniques 7.5: Synchronous System Examples 7.6: Bibliography 7.7: Problems 8. BIPOLAR AND BiCMOS LOGIC GATES 8.1: Emitter-Coupled Logic Gates 8.2: Current-Mode Logic 8.3: BiCMOS 8.4: SPICE Simulations 8.5: Bibliography 8.6: Problems 9. ADVANCED CMOS LOGIC DESIGN 9.1: Pseudo-NMOS and Dynamic Precharging 9.2: Domino-CMOS Logic 9.3: No-Race-Logic 9.4: Single-Phase Dynamic Logic 9.5: Differential CMOS 9.6: Dynamic Differential Logic 9.7: Bibliography 9.8: Problems 10. DIGITAL INTEGRATED SYSTEM BUILDING BLOCKS 10.1: Multiplexors and Decoders 10.2: Barrel Shifters 10.3: Counters 10.4: Digital Adders 10.5: Digital Multipliers 10.6: Programmable Logic Arrays 10.7: Bibliography 10.8: Problems 11. INTEGRATED MEMORIES 11.1: Static Random-Access Memories 11.2: Static Random-Access Memory Storage Cells 11.3: Address Buffers and Decoders 11.4: Dynamic Bus Precharge and Address-Transition-Detect Circuits 11.5: Modifications for Large Static Random-Access Memories 11.6: Dynamic Random-Access Memories 11.7: Read-Only Memories 11.8: Bibliography 11.9: Problems 12. GaAs DIGITAL CIRCUITS 12.1: Introduction 12.2: GaAs Processing and Components 12.3: MESFET Modeling 12.4: MESFET Second-Order Effects 12.5: Logic Design with MESFETs 12.6: Capacitively Enhanced Logic 12.7: GaAs Logic Family Comparison 12.8: Heterojunction Bipolar Technology 12.9: Bibliography 12.10: Problems 13. DIGITAL SYSTEM TESTING 13.1: Conservative Design Principles 13.2: Scan-Design Techniques 13.3: Localized Test-Vector Generation and Test-Output Compression Techniques 13.4: Boundary-Scan Testing 13.5: Bibliography 13.6: Problems Index

ISBN: 9780195125849
ISBN-10: 0195125843
Series: The Oxford Series in Electrical and Computer Engineering
Audience: Tertiary; University or College
Format: Hardcover
Language: English
Number Of Pages: 560
Published: 1st November 1999
Publisher: Oxford University Press Inc
Country of Publication: US
Dimensions (cm): 24.3 x 19.5  x 3.0
Weight (kg): 1.13